IEICE TRANSACTIONS on Electronics
High Frequency Ray-Mode Coupling Analysis of Plane Wave Diffraction by a Wide and Thick Slit on a Conducting Screen
Summary :
Diffraction field by a wide and thick slit on a conducting screen has been analyzed. High frequency ray-mode coupling analysis has been utilized, and the total diffracted or radiated field in each region is considered as a summation of successive modal radiation contribution due to the original modal excitation by the incident plane wave. Our derived results are compared with those obtained by other solutions, and good agreement has been observed, and the validity of our formulation is confirmed.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E95-C No.1 pp.10-15
- Publication Date
- 2012/01/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E95.C.10
- Type of Manuscript
- Special Section PAPER (Special Section on Recent Progress in Electromagnetic Theory and Its Application)
- Category
- Scattering and Diffraction
Authors
Keyword
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Hiroshi SHIRAI, Ryoichi SATO, "High Frequency Ray-Mode Coupling Analysis of Plane Wave Diffraction by a Wide and Thick Slit on a Conducting Screen" in IEICE TRANSACTIONS on Electronics,
vol. E95-C, no. 1, pp. 10-15, January 2012, doi: 10.1587/transele.E95.C.10.
Abstract: Diffraction field by a wide and thick slit on a conducting screen has been analyzed. High frequency ray-mode coupling analysis has been utilized, and the total diffracted or radiated field in each region is considered as a summation of successive modal radiation contribution due to the original modal excitation by the incident plane wave. Our derived results are compared with those obtained by other solutions, and good agreement has been observed, and the validity of our formulation is confirmed.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E95.C.10/_p
Copy
@ARTICLE{e95-c_1_10,
author={Hiroshi SHIRAI, Ryoichi SATO, },
journal={IEICE TRANSACTIONS on Electronics},
title={High Frequency Ray-Mode Coupling Analysis of Plane Wave Diffraction by a Wide and Thick Slit on a Conducting Screen},
year={2012},
volume={E95-C},
number={1},
pages={10-15},
abstract={Diffraction field by a wide and thick slit on a conducting screen has been analyzed. High frequency ray-mode coupling analysis has been utilized, and the total diffracted or radiated field in each region is considered as a summation of successive modal radiation contribution due to the original modal excitation by the incident plane wave. Our derived results are compared with those obtained by other solutions, and good agreement has been observed, and the validity of our formulation is confirmed.},
keywords={},
doi={10.1587/transele.E95.C.10},
ISSN={1745-1353},
month={January},}
Copy
TY - JOUR
TI - High Frequency Ray-Mode Coupling Analysis of Plane Wave Diffraction by a Wide and Thick Slit on a Conducting Screen
T2 - IEICE TRANSACTIONS on Electronics
SP - 10
EP - 15
AU - Hiroshi SHIRAI
AU - Ryoichi SATO
PY - 2012
DO - 10.1587/transele.E95.C.10
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E95-C
IS - 1
JA - IEICE TRANSACTIONS on Electronics
Y1 - January 2012
AB - Diffraction field by a wide and thick slit on a conducting screen has been analyzed. High frequency ray-mode coupling analysis has been utilized, and the total diffracted or radiated field in each region is considered as a summation of successive modal radiation contribution due to the original modal excitation by the incident plane wave. Our derived results are compared with those obtained by other solutions, and good agreement has been observed, and the validity of our formulation is confirmed.
ER -
English
