Crosstalk Analysis and Measurement Technique for High Frequency Signal Transfer in MEMs Probe Pins

Duc Long LUONG; Hyeonju BAE; Wansoo NAH

doi:10.1587/transele.E95.C.1459

Crosstalk Analysis and Measurement Technique for High Frequency Signal Transfer in MEMs Probe Pins

Duc Long LUONG, Hyeonju BAE, Wansoo NAH

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This paper develops a methodology of crosstalk analysis/measurement techniques for the design and fabrication of the MEMs (Micro-ElectroMichanical system) probe card. By introducing more ground pins into the connector pins, the crosstalk characteristics can be enhanced and a design guide for the parameters, such as pin's size and pitch is proposed to satisfy the given crosstalk limitation of -30 dB for reliable high speed signal transfer. The paper also presents a novel method to characterize scattering parameters of multiport interconnect circuits with a 4-port VNA (Vector Network Analyzer). By employing the re-normalization of scattering matrices with different reference impedances at other ports, data obtained from 4-port configuration measurements can be synthesized to build a full scattering matrix of the DUT (Device-Under-Test, MEMs probe connector pins). In comparison to the conventional 2-port VNA re-normalization method, proposed technique has two advantages: saving of measuring time, and enhanced accuracy even with open-ended unmeasured ports. A good agreement of the estimated and correct S parameters verifies the validness of the proposed algorithm.

Publication: IEICE TRANSACTIONS on Electronics Vol.E95-C No.9 pp.1459-1464

Publication Date: 2012/09/01

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Online ISSN: 1745-1353

DOI: 10.1587/transele.E95.C.1459

Type of Manuscript: Special Section PAPER (Special Section on Recent Development of Electro-Mechanical Devices - Papers selected from International Session on Electro-Mechanical Devices 2011 (IS-EMD2011) and other recent research results -)

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Duc Long LUONG, Hyeonju BAE, Wansoo NAH, "Crosstalk Analysis and Measurement Technique for High Frequency Signal Transfer in MEMs Probe Pins" in IEICE TRANSACTIONS on Electronics, vol. E95-C, no. 9, pp. 1459-1464, September 2012, doi: 10.1587/transele.E95.C.1459.
Abstract: This paper develops a methodology of crosstalk analysis/measurement techniques for the design and fabrication of the MEMs (Micro-ElectroMichanical system) probe card. By introducing more ground pins into the connector pins, the crosstalk characteristics can be enhanced and a design guide for the parameters, such as pin's size and pitch is proposed to satisfy the given crosstalk limitation of -30 dB for reliable high speed signal transfer. The paper also presents a novel method to characterize scattering parameters of multiport interconnect circuits with a 4-port VNA (Vector Network Analyzer). By employing the re-normalization of scattering matrices with different reference impedances at other ports, data obtained from 4-port configuration measurements can be synthesized to build a full scattering matrix of the DUT (Device-Under-Test, MEMs probe connector pins). In comparison to the conventional 2-port VNA re-normalization method, proposed technique has two advantages: saving of measuring time, and enhanced accuracy even with open-ended unmeasured ports. A good agreement of the estimated and correct S parameters verifies the validness of the proposed algorithm.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E95.C.1459/_p

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@ARTICLE{e95-c_9_1459,
author={Duc Long LUONG, Hyeonju BAE, Wansoo NAH, },
journal={IEICE TRANSACTIONS on Electronics},
title={Crosstalk Analysis and Measurement Technique for High Frequency Signal Transfer in MEMs Probe Pins},
year={2012},
volume={E95-C},
number={9},
pages={1459-1464},
abstract={This paper develops a methodology of crosstalk analysis/measurement techniques for the design and fabrication of the MEMs (Micro-ElectroMichanical system) probe card. By introducing more ground pins into the connector pins, the crosstalk characteristics can be enhanced and a design guide for the parameters, such as pin's size and pitch is proposed to satisfy the given crosstalk limitation of -30 dB for reliable high speed signal transfer. The paper also presents a novel method to characterize scattering parameters of multiport interconnect circuits with a 4-port VNA (Vector Network Analyzer). By employing the re-normalization of scattering matrices with different reference impedances at other ports, data obtained from 4-port configuration measurements can be synthesized to build a full scattering matrix of the DUT (Device-Under-Test, MEMs probe connector pins). In comparison to the conventional 2-port VNA re-normalization method, proposed technique has two advantages: saving of measuring time, and enhanced accuracy even with open-ended unmeasured ports. A good agreement of the estimated and correct S parameters verifies the validness of the proposed algorithm.},
keywords={},
doi={10.1587/transele.E95.C.1459},
ISSN={1745-1353},
month={September},}

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TY - JOUR
TI - Crosstalk Analysis and Measurement Technique for High Frequency Signal Transfer in MEMs Probe Pins
T2 - IEICE TRANSACTIONS on Electronics
SP - 1459
EP - 1464
AU - Duc Long LUONG
AU - Hyeonju BAE
AU - Wansoo NAH
PY - 2012
DO - 10.1587/transele.E95.C.1459
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E95-C
IS - 9
JA - IEICE TRANSACTIONS on Electronics
Y1 - September 2012
AB - This paper develops a methodology of crosstalk analysis/measurement techniques for the design and fabrication of the MEMs (Micro-ElectroMichanical system) probe card. By introducing more ground pins into the connector pins, the crosstalk characteristics can be enhanced and a design guide for the parameters, such as pin's size and pitch is proposed to satisfy the given crosstalk limitation of -30 dB for reliable high speed signal transfer. The paper also presents a novel method to characterize scattering parameters of multiport interconnect circuits with a 4-port VNA (Vector Network Analyzer). By employing the re-normalization of scattering matrices with different reference impedances at other ports, data obtained from 4-port configuration measurements can be synthesized to build a full scattering matrix of the DUT (Device-Under-Test, MEMs probe connector pins). In comparison to the conventional 2-port VNA re-normalization method, proposed technique has two advantages: saving of measuring time, and enhanced accuracy even with open-ended unmeasured ports. A good agreement of the estimated and correct S parameters verifies the validness of the proposed algorithm.
ER -