Thickness of Crystalline Layer of Rubbed Polyimide Film Characterized by Grazing Incidence X-ray Diffractions with Multi Incident Angles
Summary :
Thickness of crystalline layer induced by annealing after rubbing at surface of polyimide film for liquid crystal displays was estimated to be 3–5 nm by grazing-incidence X-ray diffractions with multi incident angles. Agreement of thickness of crystalline layer with that of initially oriented layer suggests polymer orientation induced by rubbing proceeds crystallization by annealing. Furthermore, no in-plane smectic ordering in bottom 20 nm region of polyimide film was suggested.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E97-C No.11 pp.1089-1092
- Publication Date
- 2014/11/01
- Publicized
- Online ISSN
- 1745-1353
- DOI
- 10.1587/transele.E97.C.1089
- Type of Manuscript
- BRIEF PAPER
- Category
Authors
Ichiro HIROSAWA
Japan Synchrotron Radiation Reseach Institute
Tomoyuki KOGANEZAWA
Japan Synchrotron Radiation Reseach Institute
Hidenori ISHII
Nissan Chemical Industries Ltd.
Keyword
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Ichiro HIROSAWA, Tomoyuki KOGANEZAWA, Hidenori ISHII, "Thickness of Crystalline Layer of Rubbed Polyimide Film Characterized by Grazing Incidence X-ray Diffractions with Multi Incident Angles" in IEICE TRANSACTIONS on Electronics,
vol. E97-C, no. 11, pp. 1089-1092, November 2014, doi: 10.1587/transele.E97.C.1089.
Abstract: Thickness of crystalline layer induced by annealing after rubbing at surface of polyimide film for liquid crystal displays was estimated to be 3–5 nm by grazing-incidence X-ray diffractions with multi incident angles. Agreement of thickness of crystalline layer with that of initially oriented layer suggests polymer orientation induced by rubbing proceeds crystallization by annealing. Furthermore, no in-plane smectic ordering in bottom 20 nm region of polyimide film was suggested.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/transele.E97.C.1089/_p
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@ARTICLE{e97-c_11_1089,
author={Ichiro HIROSAWA, Tomoyuki KOGANEZAWA, Hidenori ISHII, },
journal={IEICE TRANSACTIONS on Electronics},
title={Thickness of Crystalline Layer of Rubbed Polyimide Film Characterized by Grazing Incidence X-ray Diffractions with Multi Incident Angles},
year={2014},
volume={E97-C},
number={11},
pages={1089-1092},
abstract={Thickness of crystalline layer induced by annealing after rubbing at surface of polyimide film for liquid crystal displays was estimated to be 3–5 nm by grazing-incidence X-ray diffractions with multi incident angles. Agreement of thickness of crystalline layer with that of initially oriented layer suggests polymer orientation induced by rubbing proceeds crystallization by annealing. Furthermore, no in-plane smectic ordering in bottom 20 nm region of polyimide film was suggested.},
keywords={},
doi={10.1587/transele.E97.C.1089},
ISSN={1745-1353},
month={November},}
Copy
TY - JOUR
TI - Thickness of Crystalline Layer of Rubbed Polyimide Film Characterized by Grazing Incidence X-ray Diffractions with Multi Incident Angles
T2 - IEICE TRANSACTIONS on Electronics
SP - 1089
EP - 1092
AU - Ichiro HIROSAWA
AU - Tomoyuki KOGANEZAWA
AU - Hidenori ISHII
PY - 2014
DO - 10.1587/transele.E97.C.1089
JO - IEICE TRANSACTIONS on Electronics
SN - 1745-1353
VL - E97-C
IS - 11
JA - IEICE TRANSACTIONS on Electronics
Y1 - November 2014
AB - Thickness of crystalline layer induced by annealing after rubbing at surface of polyimide film for liquid crystal displays was estimated to be 3–5 nm by grazing-incidence X-ray diffractions with multi incident angles. Agreement of thickness of crystalline layer with that of initially oriented layer suggests polymer orientation induced by rubbing proceeds crystallization by annealing. Furthermore, no in-plane smectic ordering in bottom 20 nm region of polyimide film was suggested.
ER -
English
