Advances in smart card technology encourages smart card use in more sensitive applications, such as storing important information and securing application. Smart cards are however vulnerable to side channel attacks. Power consumption and electromagnetic radiation of the smart card can leak information about the secret data protected by the smart card. Our paper describes two possible hardware countermeasures that protect against side channel information leakage. We show that power analysis can be prevented by adopting photo-coupling techniques. This method involves the use of LED with photovoltaic cells and photo-couplers on the power, reset, I/O and clock lines of the smart card. This method reduces the risk of internal data bus leakage on the external data lines. Moreover, we also discuss the effectiveness of reducing electromagnetic radiation by using embedded metal plates.
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Sung-Shiou SHEN, Jung-Hui CHIU, "Prevention of Information Leakage by Photo-Coupling in Smart Card" in IEICE TRANSACTIONS on Fundamentals,
vol. E91-A, no. 1, pp. 160-167, January 2008, doi: 10.1093/ietfec/e91-a.1.160.
Abstract: Advances in smart card technology encourages smart card use in more sensitive applications, such as storing important information and securing application. Smart cards are however vulnerable to side channel attacks. Power consumption and electromagnetic radiation of the smart card can leak information about the secret data protected by the smart card. Our paper describes two possible hardware countermeasures that protect against side channel information leakage. We show that power analysis can be prevented by adopting photo-coupling techniques. This method involves the use of LED with photovoltaic cells and photo-couplers on the power, reset, I/O and clock lines of the smart card. This method reduces the risk of internal data bus leakage on the external data lines. Moreover, we also discuss the effectiveness of reducing electromagnetic radiation by using embedded metal plates.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1093/ietfec/e91-a.1.160/_p
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@ARTICLE{e91-a_1_160,
author={Sung-Shiou SHEN, Jung-Hui CHIU, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Prevention of Information Leakage by Photo-Coupling in Smart Card},
year={2008},
volume={E91-A},
number={1},
pages={160-167},
abstract={Advances in smart card technology encourages smart card use in more sensitive applications, such as storing important information and securing application. Smart cards are however vulnerable to side channel attacks. Power consumption and electromagnetic radiation of the smart card can leak information about the secret data protected by the smart card. Our paper describes two possible hardware countermeasures that protect against side channel information leakage. We show that power analysis can be prevented by adopting photo-coupling techniques. This method involves the use of LED with photovoltaic cells and photo-couplers on the power, reset, I/O and clock lines of the smart card. This method reduces the risk of internal data bus leakage on the external data lines. Moreover, we also discuss the effectiveness of reducing electromagnetic radiation by using embedded metal plates.},
keywords={},
doi={10.1093/ietfec/e91-a.1.160},
ISSN={1745-1337},
month={January},}
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TY - JOUR
TI - Prevention of Information Leakage by Photo-Coupling in Smart Card
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 160
EP - 167
AU - Sung-Shiou SHEN
AU - Jung-Hui CHIU
PY - 2008
DO - 10.1093/ietfec/e91-a.1.160
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E91-A
IS - 1
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - January 2008
AB - Advances in smart card technology encourages smart card use in more sensitive applications, such as storing important information and securing application. Smart cards are however vulnerable to side channel attacks. Power consumption and electromagnetic radiation of the smart card can leak information about the secret data protected by the smart card. Our paper describes two possible hardware countermeasures that protect against side channel information leakage. We show that power analysis can be prevented by adopting photo-coupling techniques. This method involves the use of LED with photovoltaic cells and photo-couplers on the power, reset, I/O and clock lines of the smart card. This method reduces the risk of internal data bus leakage on the external data lines. Moreover, we also discuss the effectiveness of reducing electromagnetic radiation by using embedded metal plates.
ER -