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Comparing Failure Times via Diffusion Models and Likelihood Ratio Ordering

Antonio Di CRESCENZO, Luigi M. RICCIARDI

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Summary :

For two devices whose quality is described by non-negative one-dimensional time-homogeneous diffusion processes of the Wiener and Ornstein-Uhlenbeck types sufficient conditions are given such that their failure times, modeled as first-passage times through the zero state, are ordered according to the likelihood ratio ordering.

Publication
IEICE TRANSACTIONS on Fundamentals Vol.E79-A No.9 pp.1429-1432
Publication Date
1996/09/25
Publicized
Online ISSN
DOI
Type of Manuscript
Special Section PAPER (Special Section on Information Theory and Its Applications)
Category
Stochastic Process/Learning

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