IEICE TRANSACTIONS on Fundamentals
A Selective Scan Chain Reconfiguration through Run-Length Coding for Test Data Compression and Scan Power Reduction
Summary :
Test data volume and power consumption for scan-based designs are two major concerns in system-on-a-chip testing. However, test set compaction by filling the don't-cares will invariably increase the scan-in power dissipation for scan testing, then the goals of test data reduction and low-power scan testing appear to be conflicted. Therefore, in this paper we present a selective scan chain reconfiguration method for test data compression and scan-in power reduction. The proposed method analyzes the compatibility of the internal scan cells for a given test set and then divides the scan cells into compatible classes. After the scan chain reconfiguration a dictionary is built to indicate the run-length of each compatible class and only the scan-in data for each class should be transferred from the ATE to the CUT so as to reduce test data volume. Experimental results for the larger ISCAS'89 benchmarks show that the proposed approach overcomes the limitations of traditional run-length coding techniques, and leads to highly reduced test data volume with significant power savings during scan testing in all cases.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E87-A No.12 pp.3208-3215
- Publication Date
- 2004/12/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
- Category
- Test
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Youhua SHI, Shinji KIMURA, Masao YANAGISAWA, Tatsuo OHTSUKI, "A Selective Scan Chain Reconfiguration through Run-Length Coding for Test Data Compression and Scan Power Reduction" in IEICE TRANSACTIONS on Fundamentals,
vol. E87-A, no. 12, pp. 3208-3215, December 2004, doi: .
Abstract: Test data volume and power consumption for scan-based designs are two major concerns in system-on-a-chip testing. However, test set compaction by filling the don't-cares will invariably increase the scan-in power dissipation for scan testing, then the goals of test data reduction and low-power scan testing appear to be conflicted. Therefore, in this paper we present a selective scan chain reconfiguration method for test data compression and scan-in power reduction. The proposed method analyzes the compatibility of the internal scan cells for a given test set and then divides the scan cells into compatible classes. After the scan chain reconfiguration a dictionary is built to indicate the run-length of each compatible class and only the scan-in data for each class should be transferred from the ATE to the CUT so as to reduce test data volume. Experimental results for the larger ISCAS'89 benchmarks show that the proposed approach overcomes the limitations of traditional run-length coding techniques, and leads to highly reduced test data volume with significant power savings during scan testing in all cases.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/e87-a_12_3208/_p
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@ARTICLE{e87-a_12_3208,
author={Youhua SHI, Shinji KIMURA, Masao YANAGISAWA, Tatsuo OHTSUKI, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={A Selective Scan Chain Reconfiguration through Run-Length Coding for Test Data Compression and Scan Power Reduction},
year={2004},
volume={E87-A},
number={12},
pages={3208-3215},
abstract={Test data volume and power consumption for scan-based designs are two major concerns in system-on-a-chip testing. However, test set compaction by filling the don't-cares will invariably increase the scan-in power dissipation for scan testing, then the goals of test data reduction and low-power scan testing appear to be conflicted. Therefore, in this paper we present a selective scan chain reconfiguration method for test data compression and scan-in power reduction. The proposed method analyzes the compatibility of the internal scan cells for a given test set and then divides the scan cells into compatible classes. After the scan chain reconfiguration a dictionary is built to indicate the run-length of each compatible class and only the scan-in data for each class should be transferred from the ATE to the CUT so as to reduce test data volume. Experimental results for the larger ISCAS'89 benchmarks show that the proposed approach overcomes the limitations of traditional run-length coding techniques, and leads to highly reduced test data volume with significant power savings during scan testing in all cases.},
keywords={},
doi={},
ISSN={},
month={December},}
Copy
TY - JOUR
TI - A Selective Scan Chain Reconfiguration through Run-Length Coding for Test Data Compression and Scan Power Reduction
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 3208
EP - 3215
AU - Youhua SHI
AU - Shinji KIMURA
AU - Masao YANAGISAWA
AU - Tatsuo OHTSUKI
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E87-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2004
AB - Test data volume and power consumption for scan-based designs are two major concerns in system-on-a-chip testing. However, test set compaction by filling the don't-cares will invariably increase the scan-in power dissipation for scan testing, then the goals of test data reduction and low-power scan testing appear to be conflicted. Therefore, in this paper we present a selective scan chain reconfiguration method for test data compression and scan-in power reduction. The proposed method analyzes the compatibility of the internal scan cells for a given test set and then divides the scan cells into compatible classes. After the scan chain reconfiguration a dictionary is built to indicate the run-length of each compatible class and only the scan-in data for each class should be transferred from the ATE to the CUT so as to reduce test data volume. Experimental results for the larger ISCAS'89 benchmarks show that the proposed approach overcomes the limitations of traditional run-length coding techniques, and leads to highly reduced test data volume with significant power savings during scan testing in all cases.
ER -
English
