IEICE TRANSACTIONS on Fundamentals
Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature
Summary :
VLSIs that perform signal processing near infrared sensors cooled to ultra-low temperature are demanded. Delay test of those chips must be executed at ultra-low temperature while functional test could be performed at room temperature as long as hold timing errors do not occur. In this letter, we focus on the hold timing violation and evaluate the feasibility of functional test of ultra-low temperature circuits at room temperature. Experimental evaluation with a case study shows that the functional test at room temperature is possible.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E102-A No.7 pp.914-917
- Publication Date
- 2019/07/01
- Publicized
- Online ISSN
- 1745-1337
- DOI
- 10.1587/transfun.E102.A.914
- Type of Manuscript
- Special Section LETTER (Special Section on Design Methodologies for System on a Chip)
- Category
Authors
Takahiro NAKAYAMA
Osaka University
Masanori HASHIMOTO
Osaka University
Keyword
Latest Issue
Copyrights notice of machine-translated contents
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Cite this
Copy
Takahiro NAKAYAMA, Masanori HASHIMOTO, "Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature" in IEICE TRANSACTIONS on Fundamentals,
vol. E102-A, no. 7, pp. 914-917, July 2019, doi: 10.1587/transfun.E102.A.914.
Abstract: VLSIs that perform signal processing near infrared sensors cooled to ultra-low temperature are demanded. Delay test of those chips must be executed at ultra-low temperature while functional test could be performed at room temperature as long as hold timing errors do not occur. In this letter, we focus on the hold timing violation and evaluate the feasibility of functional test of ultra-low temperature circuits at room temperature. Experimental evaluation with a case study shows that the functional test at room temperature is possible.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E102.A.914/_p
Copy
@ARTICLE{e102-a_7_914,
author={Takahiro NAKAYAMA, Masanori HASHIMOTO, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature},
year={2019},
volume={E102-A},
number={7},
pages={914-917},
abstract={VLSIs that perform signal processing near infrared sensors cooled to ultra-low temperature are demanded. Delay test of those chips must be executed at ultra-low temperature while functional test could be performed at room temperature as long as hold timing errors do not occur. In this letter, we focus on the hold timing violation and evaluate the feasibility of functional test of ultra-low temperature circuits at room temperature. Experimental evaluation with a case study shows that the functional test at room temperature is possible.},
keywords={},
doi={10.1587/transfun.E102.A.914},
ISSN={1745-1337},
month={July},}
Copy
TY - JOUR
TI - Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 914
EP - 917
AU - Takahiro NAKAYAMA
AU - Masanori HASHIMOTO
PY - 2019
DO - 10.1587/transfun.E102.A.914
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E102-A
IS - 7
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - July 2019
AB - VLSIs that perform signal processing near infrared sensors cooled to ultra-low temperature are demanded. Delay test of those chips must be executed at ultra-low temperature while functional test could be performed at room temperature as long as hold timing errors do not occur. In this letter, we focus on the hold timing violation and evaluate the feasibility of functional test of ultra-low temperature circuits at room temperature. Experimental evaluation with a case study shows that the functional test at room temperature is possible.
ER -
English
