X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction
Summary :
This paper presents a novel X-handling technique, which removes the effect of unknowns on compacted test response with maximal compaction ratio. The proposed method combines with the current X-tolerant compactors and inserts masking cells on scan paths to selectively mask X's. By doing this, the number of unknown responses in each scan-out cycle could be reduced to a reasonable level such that the target X-tolerant compactor would tolerate with guaranteed possible error detection. It guarantees no test loss due to the effect of X's, and achieves the maximal compaction that the target response compactor could provide as well. Moreover, because the masking cells are only inserted on the scan paths, it has no performance degradation of the designs. Experimental results demonstrate the effectiveness of the proposed method.
- Publication
- IEICE TRANSACTIONS on Fundamentals Vol.E92-A No.12 pp.3119-3127
- Publication Date
- 2009/12/01
- Publicized
- Online ISSN
- 1745-1337
- DOI
- 10.1587/transfun.E92.A.3119
- Type of Manuscript
- Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
- Category
- Logic Synthesis, Test and Verfication
Authors
Keyword
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Youhua SHI, Nozomu TOGAWA, Masao YANAGISAWA, Tatsuo OHTSUKI, "X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction" in IEICE TRANSACTIONS on Fundamentals,
vol. E92-A, no. 12, pp. 3119-3127, December 2009, doi: 10.1587/transfun.E92.A.3119.
Abstract: This paper presents a novel X-handling technique, which removes the effect of unknowns on compacted test response with maximal compaction ratio. The proposed method combines with the current X-tolerant compactors and inserts masking cells on scan paths to selectively mask X's. By doing this, the number of unknown responses in each scan-out cycle could be reduced to a reasonable level such that the target X-tolerant compactor would tolerate with guaranteed possible error detection. It guarantees no test loss due to the effect of X's, and achieves the maximal compaction that the target response compactor could provide as well. Moreover, because the masking cells are only inserted on the scan paths, it has no performance degradation of the designs. Experimental results demonstrate the effectiveness of the proposed method.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E92.A.3119/_p
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@ARTICLE{e92-a_12_3119,
author={Youhua SHI, Nozomu TOGAWA, Masao YANAGISAWA, Tatsuo OHTSUKI, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction},
year={2009},
volume={E92-A},
number={12},
pages={3119-3127},
abstract={This paper presents a novel X-handling technique, which removes the effect of unknowns on compacted test response with maximal compaction ratio. The proposed method combines with the current X-tolerant compactors and inserts masking cells on scan paths to selectively mask X's. By doing this, the number of unknown responses in each scan-out cycle could be reduced to a reasonable level such that the target X-tolerant compactor would tolerate with guaranteed possible error detection. It guarantees no test loss due to the effect of X's, and achieves the maximal compaction that the target response compactor could provide as well. Moreover, because the masking cells are only inserted on the scan paths, it has no performance degradation of the designs. Experimental results demonstrate the effectiveness of the proposed method.},
keywords={},
doi={10.1587/transfun.E92.A.3119},
ISSN={1745-1337},
month={December},}
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TY - JOUR
TI - X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 3119
EP - 3127
AU - Youhua SHI
AU - Nozomu TOGAWA
AU - Masao YANAGISAWA
AU - Tatsuo OHTSUKI
PY - 2009
DO - 10.1587/transfun.E92.A.3119
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E92-A
IS - 12
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - December 2009
AB - This paper presents a novel X-handling technique, which removes the effect of unknowns on compacted test response with maximal compaction ratio. The proposed method combines with the current X-tolerant compactors and inserts masking cells on scan paths to selectively mask X's. By doing this, the number of unknown responses in each scan-out cycle could be reduced to a reasonable level such that the target X-tolerant compactor would tolerate with guaranteed possible error detection. It guarantees no test loss due to the effect of X's, and achieves the maximal compaction that the target response compactor could provide as well. Moreover, because the masking cells are only inserted on the scan paths, it has no performance degradation of the designs. Experimental results demonstrate the effectiveness of the proposed method.
ER -
English
