An Automatic Method of Mapping I/O Sequences of Chip Execution onto High-level Design for Post-Silicon Debugging

Yeonbok LEE; Takeshi MATSUMOTO; Masahiro FUJITA

doi:10.1587/transfun.E94.A.1519

An Automatic Method of Mapping I/O Sequences of Chip Execution onto High-level Design for Post-Silicon Debugging

Yeonbok LEE, Takeshi MATSUMOTO, Masahiro FUJITA

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Post-silicon debugging is getting even more critical to shorten the time-to-market than ever, as many more bugs escape pre-silicon verification according to the increasing design scale and complexity. Post-silicon debugging is generally harder than pre-silicon debugging due to the limited observability and controllability of internal signal values. Conventionally, simulation of corresponding low-level designs such as RTL or gate-level has been used to get observability and controllability, which is inefficient for contemporary large designs. In this paper, we introduce a post-silicon debugging approach using simulation of high-level designs, instead of low-level designs. To realize such a debugging approach, we propose an I/O sequence mapping method that converts I/O sequences of chip executions to those of the corresponding high-level design. First, we provide a formal definition of I/O sequence mapping and relevant notions. Then, based on the definition, we propose an I/O sequence mapping method by executing FSMs representing the interface specifications of the target design. Also, we propose an implementation of the proposed method to get further efficiency. We demonstrate that the proposed method can be effectively applied to several practical design examples with various interfaces.

Publication: IEICE TRANSACTIONS on Fundamentals Vol.E94-A No.7 pp.1519-1529

Publication Date: 2011/07/01

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Online ISSN: 1745-1337

DOI: 10.1587/transfun.E94.A.1519

Type of Manuscript: PAPER

Category: VLSI Design Technology and CAD

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Yeonbok LEE, Takeshi MATSUMOTO, Masahiro FUJITA, "An Automatic Method of Mapping I/O Sequences of Chip Execution onto High-level Design for Post-Silicon Debugging" in IEICE TRANSACTIONS on Fundamentals, vol. E94-A, no. 7, pp. 1519-1529, July 2011, doi: 10.1587/transfun.E94.A.1519.
Abstract: Post-silicon debugging is getting even more critical to shorten the time-to-market than ever, as many more bugs escape pre-silicon verification according to the increasing design scale and complexity. Post-silicon debugging is generally harder than pre-silicon debugging due to the limited observability and controllability of internal signal values. Conventionally, simulation of corresponding low-level designs such as RTL or gate-level has been used to get observability and controllability, which is inefficient for contemporary large designs. In this paper, we introduce a post-silicon debugging approach using simulation of high-level designs, instead of low-level designs. To realize such a debugging approach, we propose an I/O sequence mapping method that converts I/O sequences of chip executions to those of the corresponding high-level design. First, we provide a formal definition of I/O sequence mapping and relevant notions. Then, based on the definition, we propose an I/O sequence mapping method by executing FSMs representing the interface specifications of the target design. Also, we propose an implementation of the proposed method to get further efficiency. We demonstrate that the proposed method can be effectively applied to several practical design examples with various interfaces.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/transfun.E94.A.1519/_p

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@ARTICLE{e94-a_7_1519,
author={Yeonbok LEE, Takeshi MATSUMOTO, Masahiro FUJITA, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={An Automatic Method of Mapping I/O Sequences of Chip Execution onto High-level Design for Post-Silicon Debugging},
year={2011},
volume={E94-A},
number={7},
pages={1519-1529},
abstract={Post-silicon debugging is getting even more critical to shorten the time-to-market than ever, as many more bugs escape pre-silicon verification according to the increasing design scale and complexity. Post-silicon debugging is generally harder than pre-silicon debugging due to the limited observability and controllability of internal signal values. Conventionally, simulation of corresponding low-level designs such as RTL or gate-level has been used to get observability and controllability, which is inefficient for contemporary large designs. In this paper, we introduce a post-silicon debugging approach using simulation of high-level designs, instead of low-level designs. To realize such a debugging approach, we propose an I/O sequence mapping method that converts I/O sequences of chip executions to those of the corresponding high-level design. First, we provide a formal definition of I/O sequence mapping and relevant notions. Then, based on the definition, we propose an I/O sequence mapping method by executing FSMs representing the interface specifications of the target design. Also, we propose an implementation of the proposed method to get further efficiency. We demonstrate that the proposed method can be effectively applied to several practical design examples with various interfaces.},
keywords={},
doi={10.1587/transfun.E94.A.1519},
ISSN={1745-1337},
month={July},}

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TY - JOUR
TI - An Automatic Method of Mapping I/O Sequences of Chip Execution onto High-level Design for Post-Silicon Debugging
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 1519
EP - 1529
AU - Yeonbok LEE
AU - Takeshi MATSUMOTO
AU - Masahiro FUJITA
PY - 2011
DO - 10.1587/transfun.E94.A.1519
JO - IEICE TRANSACTIONS on Fundamentals
SN - 1745-1337
VL - E94-A
IS - 7
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - July 2011
AB - Post-silicon debugging is getting even more critical to shorten the time-to-market than ever, as many more bugs escape pre-silicon verification according to the increasing design scale and complexity. Post-silicon debugging is generally harder than pre-silicon debugging due to the limited observability and controllability of internal signal values. Conventionally, simulation of corresponding low-level designs such as RTL or gate-level has been used to get observability and controllability, which is inefficient for contemporary large designs. In this paper, we introduce a post-silicon debugging approach using simulation of high-level designs, instead of low-level designs. To realize such a debugging approach, we propose an I/O sequence mapping method that converts I/O sequences of chip executions to those of the corresponding high-level design. First, we provide a formal definition of I/O sequence mapping and relevant notions. Then, based on the definition, we propose an I/O sequence mapping method by executing FSMs representing the interface specifications of the target design. Also, we propose an implementation of the proposed method to get further efficiency. We demonstrate that the proposed method can be effectively applied to several practical design examples with various interfaces.
ER -