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IEICE TRANSACTIONS on Fundamentals

Automation of Model Parameter Estimation for Random Telegraph Noise

Hirofumi SHIMIZU, Hiromitsu AWANO, Masayuki HIROMOTO, Takashi SATO

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Summary :

The modeling of random telegraph noise (RTN) of MOS transistors is becoming increasingly important. In this paper, a novel method is proposed for realizing automated estimation of two important RTN-model parameters: the number of interface-states and corresponding threshold voltage shift. The proposed method utilizes a Gaussian mixture model (GMM) to represent the voltage distributions, and estimates their parameters using the expectation-maximization (EM) algorithm. Using information criteria, the optimal estimation is automatically obtained while avoiding overfitting. In addition, we use a shared variance for all the Gaussian components in the GMM to deal with the noise in RTN signals. The proposed method improved estimation accuracy when the large measurement noise is observed.

Publication
IEICE TRANSACTIONS on Fundamentals Vol.E97-A No.12 pp.2383-2392
Publication Date
2014/12/01
Publicized
Online ISSN
1745-1337
DOI
10.1587/transfun.E97.A.2383
Type of Manuscript
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category
Device and Circuit Modeling and Analysis

Authors

Hirofumi SHIMIZU
  Kyoto University
Hiromitsu AWANO
  Kyoto University
Masayuki HIROMOTO
  Kyoto University
Takashi SATO
  Kyoto University

Keyword