Pattern extraction is an indispensable step in bare printed circuit board (PCB) inspection and plays an important role in automatic inspection system design. A good approach for pattern definition and extraction will make the following PCB diagnosis easy and efficient. The window-based technique has great potential in PCB patterns extraction due to its simplicity. The conventional window-based pattern extraction methods, such as Small Seeds Window Extraction method (SSWE) and Large Seeds Window Extraction method (LSWE), have the problems of losing some useful copper traces and splitting slanted-lines into too many small similar windows. These methods introduce the difficulty and computation intensive in automatic inspection. In this paper, a novel method called Contour Based Window Extraction (CBWE) algorithm is proposed for improvement. In comparison with both SSWE and LSWE methods, the CBWE algorithm has several advantages in application. Firstly, all traces can be segmented and enclosed by a valid window. Secondly, the type of the entire horizontal or vertical line of copper trace is preserved. Thirdly, the number of the valid windows is less than that extracted by SSWE and LSWE. From the experimental results, the proposed CBWE algorithm is demonstrated to be very effective in basic pattern extraction from bare PCB image analysis.
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Shih-Yuan HUANG, Chi-Wu MAO, Kuo-Sheng CHENG, "Contour-Based Window Extraction Algorithm for Bare Printed Circuit Board Inspection" in IEICE TRANSACTIONS on Information,
vol. E88-D, no. 12, pp. 2802-2810, December 2005, doi: 10.1093/ietisy/e88-d.12.2802.
Abstract: Pattern extraction is an indispensable step in bare printed circuit board (PCB) inspection and plays an important role in automatic inspection system design. A good approach for pattern definition and extraction will make the following PCB diagnosis easy and efficient. The window-based technique has great potential in PCB patterns extraction due to its simplicity. The conventional window-based pattern extraction methods, such as Small Seeds Window Extraction method (SSWE) and Large Seeds Window Extraction method (LSWE), have the problems of losing some useful copper traces and splitting slanted-lines into too many small similar windows. These methods introduce the difficulty and computation intensive in automatic inspection. In this paper, a novel method called Contour Based Window Extraction (CBWE) algorithm is proposed for improvement. In comparison with both SSWE and LSWE methods, the CBWE algorithm has several advantages in application. Firstly, all traces can be segmented and enclosed by a valid window. Secondly, the type of the entire horizontal or vertical line of copper trace is preserved. Thirdly, the number of the valid windows is less than that extracted by SSWE and LSWE. From the experimental results, the proposed CBWE algorithm is demonstrated to be very effective in basic pattern extraction from bare PCB image analysis.
URL: https://global.ieice.org/en_transactions/information/10.1093/ietisy/e88-d.12.2802/_p
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@ARTICLE{e88-d_12_2802,
author={Shih-Yuan HUANG, Chi-Wu MAO, Kuo-Sheng CHENG, },
journal={IEICE TRANSACTIONS on Information},
title={Contour-Based Window Extraction Algorithm for Bare Printed Circuit Board Inspection},
year={2005},
volume={E88-D},
number={12},
pages={2802-2810},
abstract={Pattern extraction is an indispensable step in bare printed circuit board (PCB) inspection and plays an important role in automatic inspection system design. A good approach for pattern definition and extraction will make the following PCB diagnosis easy and efficient. The window-based technique has great potential in PCB patterns extraction due to its simplicity. The conventional window-based pattern extraction methods, such as Small Seeds Window Extraction method (SSWE) and Large Seeds Window Extraction method (LSWE), have the problems of losing some useful copper traces and splitting slanted-lines into too many small similar windows. These methods introduce the difficulty and computation intensive in automatic inspection. In this paper, a novel method called Contour Based Window Extraction (CBWE) algorithm is proposed for improvement. In comparison with both SSWE and LSWE methods, the CBWE algorithm has several advantages in application. Firstly, all traces can be segmented and enclosed by a valid window. Secondly, the type of the entire horizontal or vertical line of copper trace is preserved. Thirdly, the number of the valid windows is less than that extracted by SSWE and LSWE. From the experimental results, the proposed CBWE algorithm is demonstrated to be very effective in basic pattern extraction from bare PCB image analysis.},
keywords={},
doi={10.1093/ietisy/e88-d.12.2802},
ISSN={},
month={December},}
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TY - JOUR
TI - Contour-Based Window Extraction Algorithm for Bare Printed Circuit Board Inspection
T2 - IEICE TRANSACTIONS on Information
SP - 2802
EP - 2810
AU - Shih-Yuan HUANG
AU - Chi-Wu MAO
AU - Kuo-Sheng CHENG
PY - 2005
DO - 10.1093/ietisy/e88-d.12.2802
JO - IEICE TRANSACTIONS on Information
SN -
VL - E88-D
IS - 12
JA - IEICE TRANSACTIONS on Information
Y1 - December 2005
AB - Pattern extraction is an indispensable step in bare printed circuit board (PCB) inspection and plays an important role in automatic inspection system design. A good approach for pattern definition and extraction will make the following PCB diagnosis easy and efficient. The window-based technique has great potential in PCB patterns extraction due to its simplicity. The conventional window-based pattern extraction methods, such as Small Seeds Window Extraction method (SSWE) and Large Seeds Window Extraction method (LSWE), have the problems of losing some useful copper traces and splitting slanted-lines into too many small similar windows. These methods introduce the difficulty and computation intensive in automatic inspection. In this paper, a novel method called Contour Based Window Extraction (CBWE) algorithm is proposed for improvement. In comparison with both SSWE and LSWE methods, the CBWE algorithm has several advantages in application. Firstly, all traces can be segmented and enclosed by a valid window. Secondly, the type of the entire horizontal or vertical line of copper trace is preserved. Thirdly, the number of the valid windows is less than that extracted by SSWE and LSWE. From the experimental results, the proposed CBWE algorithm is demonstrated to be very effective in basic pattern extraction from bare PCB image analysis.
ER -