IEICE TRANSACTIONS on Information
Pairwise Test Case Generation Based on Module Dependency
Summary :
This letter proposes a modified Pairwise test case generation algorithm. The proposed algorithm produces additional test cases that may not be covered by Pairwise algorithm due to the dependency between internal modules of software systems. The algorithm produces additional cases utilizing internal module dependencies. The algorithm effectively increases the coverage of testing without significantly increasing the number of test cases.
- Publication
- IEICE TRANSACTIONS on Information Vol.E89-D No.11 pp.2811-2813
- Publication Date
- 2006/11/01
- Publicized
- Online ISSN
- 1745-1361
- DOI
- 10.1093/ietisy/e89-d.11.2811
- Type of Manuscript
- LETTER
- Category
- Software Engineering
Authors
Keyword
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Jangbok KIM, Kyunghee CHOI, Gihyun JUNG, "Pairwise Test Case Generation Based on Module Dependency" in IEICE TRANSACTIONS on Information,
vol. E89-D, no. 11, pp. 2811-2813, November 2006, doi: 10.1093/ietisy/e89-d.11.2811.
Abstract: This letter proposes a modified Pairwise test case generation algorithm. The proposed algorithm produces additional test cases that may not be covered by Pairwise algorithm due to the dependency between internal modules of software systems. The algorithm produces additional cases utilizing internal module dependencies. The algorithm effectively increases the coverage of testing without significantly increasing the number of test cases.
URL: https://global.ieice.org/en_transactions/information/10.1093/ietisy/e89-d.11.2811/_p
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@ARTICLE{e89-d_11_2811,
author={Jangbok KIM, Kyunghee CHOI, Gihyun JUNG, },
journal={IEICE TRANSACTIONS on Information},
title={Pairwise Test Case Generation Based on Module Dependency},
year={2006},
volume={E89-D},
number={11},
pages={2811-2813},
abstract={This letter proposes a modified Pairwise test case generation algorithm. The proposed algorithm produces additional test cases that may not be covered by Pairwise algorithm due to the dependency between internal modules of software systems. The algorithm produces additional cases utilizing internal module dependencies. The algorithm effectively increases the coverage of testing without significantly increasing the number of test cases.},
keywords={},
doi={10.1093/ietisy/e89-d.11.2811},
ISSN={1745-1361},
month={November},}
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TY - JOUR
TI - Pairwise Test Case Generation Based on Module Dependency
T2 - IEICE TRANSACTIONS on Information
SP - 2811
EP - 2813
AU - Jangbok KIM
AU - Kyunghee CHOI
AU - Gihyun JUNG
PY - 2006
DO - 10.1093/ietisy/e89-d.11.2811
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E89-D
IS - 11
JA - IEICE TRANSACTIONS on Information
Y1 - November 2006
AB - This letter proposes a modified Pairwise test case generation algorithm. The proposed algorithm produces additional test cases that may not be covered by Pairwise algorithm due to the dependency between internal modules of software systems. The algorithm produces additional cases utilizing internal module dependencies. The algorithm effectively increases the coverage of testing without significantly increasing the number of test cases.
ER -
English
