IEICE TRANSACTIONS on Information
A Method of Locating Open Faults on Incompletely Identified Pass/Fail Information
Summary :
In order to reduce the test cost, built-in self test (BIST) is widely used. One of the serious problems of BIST is that the compacted signature in BIST has very little information for fault diagnosis. Especially, it is difficult to determine which tests detect a fault. Therefore, it is important to develop an efficient fault diagnosis method by using incompletely identified pass/fail information. Where the incompletely identified pass/fail information means that a failing test block consists of at least one failing test and some passing tests, and all of the tests in passing test blocks are the passing test. In this paper, we propose a method to locate open faults by using incompletely identified pass/fail information. Experimental results for ISCAS'85 and ITC'99 benchmark circuits show that the number of candidate faults becomes less than 5 in many cases.
- Publication
- IEICE TRANSACTIONS on Information Vol.E91-D No.3 pp.661-666
- Publication Date
- 2008/03/01
- Publicized
- Online ISSN
- 1745-1361
- DOI
- 10.1093/ietisy/e91-d.3.661
- Type of Manuscript
- Special Section PAPER (Special Section on Test and Verification of VLSIs)
- Category
- Fault Diagnosis
Authors
Keyword
Latest Issue
Copyrights notice of machine-translated contents
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Cite this
Copy
Koji YAMAZAKI, Yuzo TAKAMATSU, "A Method of Locating Open Faults on Incompletely Identified Pass/Fail Information" in IEICE TRANSACTIONS on Information,
vol. E91-D, no. 3, pp. 661-666, March 2008, doi: 10.1093/ietisy/e91-d.3.661.
Abstract: In order to reduce the test cost, built-in self test (BIST) is widely used. One of the serious problems of BIST is that the compacted signature in BIST has very little information for fault diagnosis. Especially, it is difficult to determine which tests detect a fault. Therefore, it is important to develop an efficient fault diagnosis method by using incompletely identified pass/fail information. Where the incompletely identified pass/fail information means that a failing test block consists of at least one failing test and some passing tests, and all of the tests in passing test blocks are the passing test. In this paper, we propose a method to locate open faults by using incompletely identified pass/fail information. Experimental results for ISCAS'85 and ITC'99 benchmark circuits show that the number of candidate faults becomes less than 5 in many cases.
URL: https://global.ieice.org/en_transactions/information/10.1093/ietisy/e91-d.3.661/_p
Copy
@ARTICLE{e91-d_3_661,
author={Koji YAMAZAKI, Yuzo TAKAMATSU, },
journal={IEICE TRANSACTIONS on Information},
title={A Method of Locating Open Faults on Incompletely Identified Pass/Fail Information},
year={2008},
volume={E91-D},
number={3},
pages={661-666},
abstract={In order to reduce the test cost, built-in self test (BIST) is widely used. One of the serious problems of BIST is that the compacted signature in BIST has very little information for fault diagnosis. Especially, it is difficult to determine which tests detect a fault. Therefore, it is important to develop an efficient fault diagnosis method by using incompletely identified pass/fail information. Where the incompletely identified pass/fail information means that a failing test block consists of at least one failing test and some passing tests, and all of the tests in passing test blocks are the passing test. In this paper, we propose a method to locate open faults by using incompletely identified pass/fail information. Experimental results for ISCAS'85 and ITC'99 benchmark circuits show that the number of candidate faults becomes less than 5 in many cases.},
keywords={},
doi={10.1093/ietisy/e91-d.3.661},
ISSN={1745-1361},
month={March},}
Copy
TY - JOUR
TI - A Method of Locating Open Faults on Incompletely Identified Pass/Fail Information
T2 - IEICE TRANSACTIONS on Information
SP - 661
EP - 666
AU - Koji YAMAZAKI
AU - Yuzo TAKAMATSU
PY - 2008
DO - 10.1093/ietisy/e91-d.3.661
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E91-D
IS - 3
JA - IEICE TRANSACTIONS on Information
Y1 - March 2008
AB - In order to reduce the test cost, built-in self test (BIST) is widely used. One of the serious problems of BIST is that the compacted signature in BIST has very little information for fault diagnosis. Especially, it is difficult to determine which tests detect a fault. Therefore, it is important to develop an efficient fault diagnosis method by using incompletely identified pass/fail information. Where the incompletely identified pass/fail information means that a failing test block consists of at least one failing test and some passing tests, and all of the tests in passing test blocks are the passing test. In this paper, we propose a method to locate open faults by using incompletely identified pass/fail information. Experimental results for ISCAS'85 and ITC'99 benchmark circuits show that the number of candidate faults becomes less than 5 in many cases.
ER -
English
