Analysis of Fault Detection Probability of Random Access Memories in Applying Random Patterns
Summary :
We considered the random testing for memories, such that addresses are randomly generated but every cell is evenly accessed, and analyzed the fault detection probability. As the result, the random testing turned out to be an effective testing method for the BIST of embedded memories.
- Publication
- IEICE TRANSACTIONS on Information Vol.E74-D No.11 pp.3910-3920
- Publication Date
- 1991/11/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- LETTER
- Category
- Fault Tolerant Computing
Authors
Keyword
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Hideo TAMAMOTO, Tatsumi OHTAKA, Yuichi NARITA, "Analysis of Fault Detection Probability of Random Access Memories in Applying Random Patterns" in IEICE TRANSACTIONS on Information,
vol. E74-D, no. 11, pp. 3910-3920, November 1991, doi: .
Abstract: We considered the random testing for memories, such that addresses are randomly generated but every cell is evenly accessed, and analyzed the fault detection probability. As the result, the random testing turned out to be an effective testing method for the BIST of embedded memories.
URL: https://global.ieice.org/en_transactions/information/10.1587/e74-d_11_3910/_p
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@ARTICLE{e74-d_11_3910,
author={Hideo TAMAMOTO, Tatsumi OHTAKA, Yuichi NARITA, },
journal={IEICE TRANSACTIONS on Information},
title={Analysis of Fault Detection Probability of Random Access Memories in Applying Random Patterns},
year={1991},
volume={E74-D},
number={11},
pages={3910-3920},
abstract={We considered the random testing for memories, such that addresses are randomly generated but every cell is evenly accessed, and analyzed the fault detection probability. As the result, the random testing turned out to be an effective testing method for the BIST of embedded memories.},
keywords={},
doi={},
ISSN={},
month={November},}
Copy
TY - JOUR
TI - Analysis of Fault Detection Probability of Random Access Memories in Applying Random Patterns
T2 - IEICE TRANSACTIONS on Information
SP - 3910
EP - 3920
AU - Hideo TAMAMOTO
AU - Tatsumi OHTAKA
AU - Yuichi NARITA
PY - 1991
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E74-D
IS - 11
JA - IEICE TRANSACTIONS on Information
Y1 - November 1991
AB - We considered the random testing for memories, such that addresses are randomly generated but every cell is evenly accessed, and analyzed the fault detection probability. As the result, the random testing turned out to be an effective testing method for the BIST of embedded memories.
ER -
English
