On the Diagnosis of Two-Dimensional Grid of Processors
Summary :
We examine diagnosis of processor array systems formed as two-dimensional grids, with boundaries, and either four or eight neighbors for each interior processor. We employ a parallel test schedule. Neighboring processors test each other and report the results. Our diagnostic objective is to find a fault-free processor or set of processors. The system may then be sequentially diagnosed by repairing those processors tested faulty according to the identified fault-free set. We establish an upper bound on the maximum number of faults that can be sustained without invalidating the test results under worst case conditions. We give test schedules and diagnostic algorithms that meet the upper bound as far as the highest order term. We compare these near optimal diagnostic algorithms to alternative algorithms--both new and already in the literature.
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- IEICE TRANSACTIONS on Information Vol.E84-D No.11 pp.1486-1499
- Publication Date
- 2001/11/01
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- Special Section PAPER (Special Issue on Function Integrated Information Systems)
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Jun ZHAO, Fred J. MEYER, Nohpill PARK, Fabrizio LOMBARDI, "On the Diagnosis of Two-Dimensional Grid of Processors" in IEICE TRANSACTIONS on Information,
vol. E84-D, no. 11, pp. 1486-1499, November 2001, doi: .
Abstract: We examine diagnosis of processor array systems formed as two-dimensional grids, with boundaries, and either four or eight neighbors for each interior processor. We employ a parallel test schedule. Neighboring processors test each other and report the results. Our diagnostic objective is to find a fault-free processor or set of processors. The system may then be sequentially diagnosed by repairing those processors tested faulty according to the identified fault-free set. We establish an upper bound on the maximum number of faults that can be sustained without invalidating the test results under worst case conditions. We give test schedules and diagnostic algorithms that meet the upper bound as far as the highest order term. We compare these near optimal diagnostic algorithms to alternative algorithms--both new and already in the literature.
URL: https://global.ieice.org/en_transactions/information/10.1587/e84-d_11_1486/_p
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@ARTICLE{e84-d_11_1486,
author={Jun ZHAO, Fred J. MEYER, Nohpill PARK, Fabrizio LOMBARDI, },
journal={IEICE TRANSACTIONS on Information},
title={On the Diagnosis of Two-Dimensional Grid of Processors},
year={2001},
volume={E84-D},
number={11},
pages={1486-1499},
abstract={We examine diagnosis of processor array systems formed as two-dimensional grids, with boundaries, and either four or eight neighbors for each interior processor. We employ a parallel test schedule. Neighboring processors test each other and report the results. Our diagnostic objective is to find a fault-free processor or set of processors. The system may then be sequentially diagnosed by repairing those processors tested faulty according to the identified fault-free set. We establish an upper bound on the maximum number of faults that can be sustained without invalidating the test results under worst case conditions. We give test schedules and diagnostic algorithms that meet the upper bound as far as the highest order term. We compare these near optimal diagnostic algorithms to alternative algorithms--both new and already in the literature.},
keywords={},
doi={},
ISSN={},
month={November},}
Copy
TY - JOUR
TI - On the Diagnosis of Two-Dimensional Grid of Processors
T2 - IEICE TRANSACTIONS on Information
SP - 1486
EP - 1499
AU - Jun ZHAO
AU - Fred J. MEYER
AU - Nohpill PARK
AU - Fabrizio LOMBARDI
PY - 2001
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E84-D
IS - 11
JA - IEICE TRANSACTIONS on Information
Y1 - November 2001
AB - We examine diagnosis of processor array systems formed as two-dimensional grids, with boundaries, and either four or eight neighbors for each interior processor. We employ a parallel test schedule. Neighboring processors test each other and report the results. Our diagnostic objective is to find a fault-free processor or set of processors. The system may then be sequentially diagnosed by repairing those processors tested faulty according to the identified fault-free set. We establish an upper bound on the maximum number of faults that can be sustained without invalidating the test results under worst case conditions. We give test schedules and diagnostic algorithms that meet the upper bound as far as the highest order term. We compare these near optimal diagnostic algorithms to alternative algorithms--both new and already in the literature.
ER -
English
