IEICE TRANSACTIONS on Information
A Random Walk through Eigenspace
Summary :
It has been over a decade since the "Eigenfaces" approach to automatic face recognition, and other appearance-based methods, made an impression on the computer vision research community and helped spur interest in vision systems being used to support biometrics and human-computer interface. In this paper I give a personal view of the original motivation for the work, some of the strengths and limitation of the approach, and progress in the years since. Appearance-based approaches to recognition complement feature- or shape-based approaches, and a practical face recognition system should have elements of both. Eigenfaces is not a general approach to recognition, but rather one tool out of many to be applied and evaluated in the appropriate context.
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- IEICE TRANSACTIONS on Information Vol.E84-D No.12 pp.1586-1595
- Publication Date
- 2001/12/01
- Publicized
- Online ISSN
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- Type of Manuscript
- Special Section INVITED PAPER (Special Issue on Machine Vision Applications)
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Matthew TURK, "A Random Walk through Eigenspace" in IEICE TRANSACTIONS on Information,
vol. E84-D, no. 12, pp. 1586-1595, December 2001, doi: .
Abstract: It has been over a decade since the "Eigenfaces" approach to automatic face recognition, and other appearance-based methods, made an impression on the computer vision research community and helped spur interest in vision systems being used to support biometrics and human-computer interface. In this paper I give a personal view of the original motivation for the work, some of the strengths and limitation of the approach, and progress in the years since. Appearance-based approaches to recognition complement feature- or shape-based approaches, and a practical face recognition system should have elements of both. Eigenfaces is not a general approach to recognition, but rather one tool out of many to be applied and evaluated in the appropriate context.
URL: https://global.ieice.org/en_transactions/information/10.1587/e84-d_12_1586/_p
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@ARTICLE{e84-d_12_1586,
author={Matthew TURK, },
journal={IEICE TRANSACTIONS on Information},
title={A Random Walk through Eigenspace},
year={2001},
volume={E84-D},
number={12},
pages={1586-1595},
abstract={It has been over a decade since the "Eigenfaces" approach to automatic face recognition, and other appearance-based methods, made an impression on the computer vision research community and helped spur interest in vision systems being used to support biometrics and human-computer interface. In this paper I give a personal view of the original motivation for the work, some of the strengths and limitation of the approach, and progress in the years since. Appearance-based approaches to recognition complement feature- or shape-based approaches, and a practical face recognition system should have elements of both. Eigenfaces is not a general approach to recognition, but rather one tool out of many to be applied and evaluated in the appropriate context.},
keywords={},
doi={},
ISSN={},
month={December},}
Copy
TY - JOUR
TI - A Random Walk through Eigenspace
T2 - IEICE TRANSACTIONS on Information
SP - 1586
EP - 1595
AU - Matthew TURK
PY - 2001
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E84-D
IS - 12
JA - IEICE TRANSACTIONS on Information
Y1 - December 2001
AB - It has been over a decade since the "Eigenfaces" approach to automatic face recognition, and other appearance-based methods, made an impression on the computer vision research community and helped spur interest in vision systems being used to support biometrics and human-computer interface. In this paper I give a personal view of the original motivation for the work, some of the strengths and limitation of the approach, and progress in the years since. Appearance-based approaches to recognition complement feature- or shape-based approaches, and a practical face recognition system should have elements of both. Eigenfaces is not a general approach to recognition, but rather one tool out of many to be applied and evaluated in the appropriate context.
ER -
English
