IEICE TRANSACTIONS on Information
Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States
Summary :
A procedure to remove redundancies in sequential circuits is proposed using strongly unreachable states, which are the states with no incoming transitions. Test generation is used to find undetectable faults related to two or more strongly unreachable states. Experimental results show the new procedure can find more redundancies of sequential circuits.
- Publication
- IEICE TRANSACTIONS on Information Vol.E85-D No.10 pp.1605-1608
- Publication Date
- 2002/10/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section LETTER (Special Issue on Test and Verification of VLSI)
- Category
Authors
Keyword
Latest Issue
Copyrights notice of machine-translated contents
The copyright of the original papers published on this site belongs to IEICE. Unauthorized use of the original or translated papers is prohibited. See IEICE Provisions on Copyright for details.
Cite this
Copy
Hiroyuki YOTSUYANAGI, Masaki HASHIZUME, Takeomi TAMESADA, "Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States" in IEICE TRANSACTIONS on Information,
vol. E85-D, no. 10, pp. 1605-1608, October 2002, doi: .
Abstract: A procedure to remove redundancies in sequential circuits is proposed using strongly unreachable states, which are the states with no incoming transitions. Test generation is used to find undetectable faults related to two or more strongly unreachable states. Experimental results show the new procedure can find more redundancies of sequential circuits.
URL: https://global.ieice.org/en_transactions/information/10.1587/e85-d_10_1605/_p
Copy
@ARTICLE{e85-d_10_1605,
author={Hiroyuki YOTSUYANAGI, Masaki HASHIZUME, Takeomi TAMESADA, },
journal={IEICE TRANSACTIONS on Information},
title={Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States},
year={2002},
volume={E85-D},
number={10},
pages={1605-1608},
abstract={A procedure to remove redundancies in sequential circuits is proposed using strongly unreachable states, which are the states with no incoming transitions. Test generation is used to find undetectable faults related to two or more strongly unreachable states. Experimental results show the new procedure can find more redundancies of sequential circuits.},
keywords={},
doi={},
ISSN={},
month={October},}
Copy
TY - JOUR
TI - Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States
T2 - IEICE TRANSACTIONS on Information
SP - 1605
EP - 1608
AU - Hiroyuki YOTSUYANAGI
AU - Masaki HASHIZUME
AU - Takeomi TAMESADA
PY - 2002
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E85-D
IS - 10
JA - IEICE TRANSACTIONS on Information
Y1 - October 2002
AB - A procedure to remove redundancies in sequential circuits is proposed using strongly unreachable states, which are the states with no incoming transitions. Test generation is used to find undetectable faults related to two or more strongly unreachable states. Experimental results show the new procedure can find more redundancies of sequential circuits.
ER -
English
