A procedure to remove redundancies in sequential circuits is proposed using strongly unreachable states, which are the states with no incoming transitions. Test generation is used to find undetectable faults related to two or more strongly unreachable states. Experimental results show the new procedure can find more redundancies of sequential circuits.
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Hiroyuki YOTSUYANAGI, Masaki HASHIZUME, Takeomi TAMESADA, "Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States" in IEICE TRANSACTIONS on Information,
vol. E85-D, no. 10, pp. 1605-1608, October 2002, doi: .
Abstract: A procedure to remove redundancies in sequential circuits is proposed using strongly unreachable states, which are the states with no incoming transitions. Test generation is used to find undetectable faults related to two or more strongly unreachable states. Experimental results show the new procedure can find more redundancies of sequential circuits.
URL: https://global.ieice.org/en_transactions/information/10.1587/e85-d_10_1605/_p
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@ARTICLE{e85-d_10_1605,
author={Hiroyuki YOTSUYANAGI, Masaki HASHIZUME, Takeomi TAMESADA, },
journal={IEICE TRANSACTIONS on Information},
title={Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States},
year={2002},
volume={E85-D},
number={10},
pages={1605-1608},
abstract={A procedure to remove redundancies in sequential circuits is proposed using strongly unreachable states, which are the states with no incoming transitions. Test generation is used to find undetectable faults related to two or more strongly unreachable states. Experimental results show the new procedure can find more redundancies of sequential circuits.},
keywords={},
doi={},
ISSN={},
month={October},}
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TY - JOUR
TI - Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States
T2 - IEICE TRANSACTIONS on Information
SP - 1605
EP - 1608
AU - Hiroyuki YOTSUYANAGI
AU - Masaki HASHIZUME
AU - Takeomi TAMESADA
PY - 2002
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E85-D
IS - 10
JA - IEICE TRANSACTIONS on Information
Y1 - October 2002
AB - A procedure to remove redundancies in sequential circuits is proposed using strongly unreachable states, which are the states with no incoming transitions. Test generation is used to find undetectable faults related to two or more strongly unreachable states. Experimental results show the new procedure can find more redundancies of sequential circuits.
ER -