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Sequential Redundancy Removal Using Test Generation and Multiple Strongly Unreachable States

Hiroyuki YOTSUYANAGI, Masaki HASHIZUME, Takeomi TAMESADA

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Summary :

A procedure to remove redundancies in sequential circuits is proposed using strongly unreachable states, which are the states with no incoming transitions. Test generation is used to find undetectable faults related to two or more strongly unreachable states. Experimental results show the new procedure can find more redundancies of sequential circuits.

Publication
IEICE TRANSACTIONS on Information Vol.E85-D No.10 pp.1605-1608
Publication Date
2002/10/01
Publicized
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DOI
Type of Manuscript
Special Section LETTER (Special Issue on Test and Verification of VLSI)
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