Automatic Detection of Region-Mura Defect in TFT-LCD

Jae Yeong LEE; Suk In YOO

Automatic Detection of Region-Mura Defect in TFT-LCD

Jae Yeong LEE, Suk In YOO

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Visual defects, called mura in the field, sometimes occur during the manufacturing of the flat panel liquid crystal displays. In this paper we propose an automatic inspection method that reliably detects and quantifies TFT-LCD region-mura defects. The method consists of two phases. In the first phase we segment candidate region-muras from TFT-LCD panel images using the modified regression diagnostics and Niblack's thresholding. In the second phase, based on the human eye's sensitivity to mura, we quantify mura level for each candidate, which is used to identify real muras by grading them as pass or fail. Performance of the proposed method is evaluated on real TFT-LCD panel samples.

Publication: IEICE TRANSACTIONS on Information Vol.E87-D No.10 pp.2371-2378

Publication Date: 2004/10/01

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Type of Manuscript: PAPER

Category: Image Processing and Video Processing

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Jae Yeong LEE, Suk In YOO, "Automatic Detection of Region-Mura Defect in TFT-LCD" in IEICE TRANSACTIONS on Information, vol. E87-D, no. 10, pp. 2371-2378, October 2004, doi: .
Abstract: Visual defects, called mura in the field, sometimes occur during the manufacturing of the flat panel liquid crystal displays. In this paper we propose an automatic inspection method that reliably detects and quantifies TFT-LCD region-mura defects. The method consists of two phases. In the first phase we segment candidate region-muras from TFT-LCD panel images using the modified regression diagnostics and Niblack's thresholding. In the second phase, based on the human eye's sensitivity to mura, we quantify mura level for each candidate, which is used to identify real muras by grading them as pass or fail. Performance of the proposed method is evaluated on real TFT-LCD panel samples.
URL: https://global.ieice.org/en_transactions/information/10.1587/e87-d_10_2371/_p

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@ARTICLE{e87-d_10_2371,
author={Jae Yeong LEE, Suk In YOO, },
journal={IEICE TRANSACTIONS on Information},
title={Automatic Detection of Region-Mura Defect in TFT-LCD},
year={2004},
volume={E87-D},
number={10},
pages={2371-2378},
abstract={Visual defects, called mura in the field, sometimes occur during the manufacturing of the flat panel liquid crystal displays. In this paper we propose an automatic inspection method that reliably detects and quantifies TFT-LCD region-mura defects. The method consists of two phases. In the first phase we segment candidate region-muras from TFT-LCD panel images using the modified regression diagnostics and Niblack's thresholding. In the second phase, based on the human eye's sensitivity to mura, we quantify mura level for each candidate, which is used to identify real muras by grading them as pass or fail. Performance of the proposed method is evaluated on real TFT-LCD panel samples.},
keywords={},
doi={},
ISSN={},
month={October},}

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TY - JOUR
TI - Automatic Detection of Region-Mura Defect in TFT-LCD
T2 - IEICE TRANSACTIONS on Information
SP - 2371
EP - 2378
AU - Jae Yeong LEE
AU - Suk In YOO
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E87-D
IS - 10
JA - IEICE TRANSACTIONS on Information
Y1 - October 2004
AB - Visual defects, called mura in the field, sometimes occur during the manufacturing of the flat panel liquid crystal displays. In this paper we propose an automatic inspection method that reliably detects and quantifies TFT-LCD region-mura defects. The method consists of two phases. In the first phase we segment candidate region-muras from TFT-LCD panel images using the modified regression diagnostics and Niblack's thresholding. In the second phase, based on the human eye's sensitivity to mura, we quantify mura level for each candidate, which is used to identify real muras by grading them as pass or fail. Performance of the proposed method is evaluated on real TFT-LCD panel samples.
ER -