Analog Circuit Test Using Transfer Function Coefficient Estimates
Summary :
Coefficient-based test (CBT) is introduced for detecting parametric faults in analog circuits. The method uses pseudo Monte-Carlo simulation and system identification tools to determine whether a given circuit under test (CUT) is faulty.
- Publication
- IEICE TRANSACTIONS on Information Vol.E87-D No.3 pp.642-646
- Publication Date
- 2004/03/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section LETTER (Special Section on Test and Verification of VLSI)
- Category
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Zhen GUO, Jacob SAVIR, "Analog Circuit Test Using Transfer Function Coefficient Estimates" in IEICE TRANSACTIONS on Information,
vol. E87-D, no. 3, pp. 642-646, March 2004, doi: .
Abstract: Coefficient-based test (CBT) is introduced for detecting parametric faults in analog circuits. The method uses pseudo Monte-Carlo simulation and system identification tools to determine whether a given circuit under test (CUT) is faulty.
URL: https://global.ieice.org/en_transactions/information/10.1587/e87-d_3_642/_p
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@ARTICLE{e87-d_3_642,
author={Zhen GUO, Jacob SAVIR, },
journal={IEICE TRANSACTIONS on Information},
title={Analog Circuit Test Using Transfer Function Coefficient Estimates},
year={2004},
volume={E87-D},
number={3},
pages={642-646},
abstract={Coefficient-based test (CBT) is introduced for detecting parametric faults in analog circuits. The method uses pseudo Monte-Carlo simulation and system identification tools to determine whether a given circuit under test (CUT) is faulty.},
keywords={},
doi={},
ISSN={},
month={March},}
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TY - JOUR
TI - Analog Circuit Test Using Transfer Function Coefficient Estimates
T2 - IEICE TRANSACTIONS on Information
SP - 642
EP - 646
AU - Zhen GUO
AU - Jacob SAVIR
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E87-D
IS - 3
JA - IEICE TRANSACTIONS on Information
Y1 - March 2004
AB - Coefficient-based test (CBT) is introduced for detecting parametric faults in analog circuits. The method uses pseudo Monte-Carlo simulation and system identification tools to determine whether a given circuit under test (CUT) is faulty.
ER -
English
