Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration
Summary :
Although open defects are hard to diagnose because they are unstable, we developed a technique to diagnose completely open defects. We applied a new "segment model" that takes the coupling effects on a defective node that are caused by neighboring nodes into consideration. This technique is used to focuse not only on the behavior of the defective node, but also on the behavior of other nodes affecting its behavior. We explain the theoretical treatment of our model and present experimental results obtained from an actual chip.
- Publication
- IEICE TRANSACTIONS on Information Vol.E87-D No.9 pp.2179-2185
- Publication Date
- 2004/09/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- PAPER
- Category
- Dependable Computing
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Yasuo SATO, Iwao YAMAZAKI, Hiroki YAMANAKA, Toshio IKEDA, Masahiro TAKAKURA, Kazuhiko IWASAKI, "Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration" in IEICE TRANSACTIONS on Information,
vol. E87-D, no. 9, pp. 2179-2185, September 2004, doi: .
Abstract: Although open defects are hard to diagnose because they are unstable, we developed a technique to diagnose completely open defects. We applied a new "segment model" that takes the coupling effects on a defective node that are caused by neighboring nodes into consideration. This technique is used to focuse not only on the behavior of the defective node, but also on the behavior of other nodes affecting its behavior. We explain the theoretical treatment of our model and present experimental results obtained from an actual chip.
URL: https://global.ieice.org/en_transactions/information/10.1587/e87-d_9_2179/_p
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@ARTICLE{e87-d_9_2179,
author={Yasuo SATO, Iwao YAMAZAKI, Hiroki YAMANAKA, Toshio IKEDA, Masahiro TAKAKURA, Kazuhiko IWASAKI, },
journal={IEICE TRANSACTIONS on Information},
title={Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration},
year={2004},
volume={E87-D},
number={9},
pages={2179-2185},
abstract={Although open defects are hard to diagnose because they are unstable, we developed a technique to diagnose completely open defects. We applied a new "segment model" that takes the coupling effects on a defective node that are caused by neighboring nodes into consideration. This technique is used to focuse not only on the behavior of the defective node, but also on the behavior of other nodes affecting its behavior. We explain the theoretical treatment of our model and present experimental results obtained from an actual chip.},
keywords={},
doi={},
ISSN={},
month={September},}
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TY - JOUR
TI - Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration
T2 - IEICE TRANSACTIONS on Information
SP - 2179
EP - 2185
AU - Yasuo SATO
AU - Iwao YAMAZAKI
AU - Hiroki YAMANAKA
AU - Toshio IKEDA
AU - Masahiro TAKAKURA
AU - Kazuhiko IWASAKI
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E87-D
IS - 9
JA - IEICE TRANSACTIONS on Information
Y1 - September 2004
AB - Although open defects are hard to diagnose because they are unstable, we developed a technique to diagnose completely open defects. We applied a new "segment model" that takes the coupling effects on a defective node that are caused by neighboring nodes into consideration. This technique is used to focuse not only on the behavior of the defective node, but also on the behavior of other nodes affecting its behavior. We explain the theoretical treatment of our model and present experimental results obtained from an actual chip.
ER -
English
