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IEICE TRANSACTIONS on Information

Corrected Stochastic Dual Coordinate Ascent for Top-k SVM

Yoshihiro HIROHASHI, Tsuyoshi KATO

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Summary :

Currently, the top-k error ratio is one of the primary methods to measure the accuracy of multi-category classification. Top-k multiclass SVM was designed to minimize the empirical risk based on the top-k error ratio. Two SDCA-based algorithms exist for learning the top-k SVM, both of which have several desirable properties for achieving optimization. However, both algorithms suffer from a serious disadvantage, that is, they cannot attain the optimal convergence in most cases owing to their theoretical imperfections. As demonstrated through numerical simulations, if the modified SDCA algorithm is employed, optimal convergence is always achieved, in contrast to the failure of the two existing SDCA-based algorithms. Finally, our analytical results are presented to clarify the significance of these existing algorithms.

Publication
IEICE TRANSACTIONS on Information Vol.E103-D No.11 pp.2323-2331
Publication Date
2020/11/01
Publicized
2020/08/06
Online ISSN
1745-1361
DOI
10.1587/transinf.2019EDP7261
Type of Manuscript
PAPER
Category
Pattern Recognition

Authors

Yoshihiro HIROHASHI
  DENSO CORPORATION
Tsuyoshi KATO
  Gunma University

Keyword