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An Effective Programmable Memory BIST for Embedded Memory

Youngkyu PARK, Jaeseok PARK, Taewoo HAN, Sungho KANG

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Summary :

This paper proposes a micro-code based Programmable Memory BIST (PMBIST) architecture that can support various kinds of test algorithms. The proposed Non-linear PMBIST (NPMBIST) guarantees high flexibility and high fault coverage using not only March algorithms but also non-linear algorithms such as Walking and Galloping. This NPMBIST has an optimized hardware overhead, since algorithms can be implemented with the minimum bits by the optimized instructions. Finally, various and complex algorithms can be run thanks to its support of multi-loop.

Publication
IEICE TRANSACTIONS on Information Vol.E92-D No.12 pp.2508-2511
Publication Date
2009/12/01
Publicized
Online ISSN
1745-1361
DOI
10.1587/transinf.E92.D.2508
Type of Manuscript
LETTER
Category
Computer Components

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