IEICE TRANSACTIONS on Information
Selective Scan Slice Grouping Technique for Efficient Test Data Compression
Summary :
This paper presents a selective scan slice grouping technique for test data compression. In conventional selective encoding methods, the existence of a conflict bit contributes to large encoding data. However, many conflict bits are efficiently removed using the scan slice grouping technique, which leads to a dramatic improvement of encoding efficiency. Experiments performed with large ITC'99 benchmark circuits presents the effectiveness of the proposed technique and the test data volume is reduced up to 92% compared to random-filled test patterns.
- Publication
- IEICE TRANSACTIONS on Information Vol.E93-D No.2 pp.380-383
- Publication Date
- 2010/02/01
- Publicized
- Online ISSN
- 1745-1361
- DOI
- 10.1587/transinf.E93.D.380
- Type of Manuscript
- LETTER
- Category
- Dependable Computing
Authors
Keyword
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Yongjoon KIM, Jaeseok PARK, Sungho KANG, "Selective Scan Slice Grouping Technique for Efficient Test Data Compression" in IEICE TRANSACTIONS on Information,
vol. E93-D, no. 2, pp. 380-383, February 2010, doi: 10.1587/transinf.E93.D.380.
Abstract: This paper presents a selective scan slice grouping technique for test data compression. In conventional selective encoding methods, the existence of a conflict bit contributes to large encoding data. However, many conflict bits are efficiently removed using the scan slice grouping technique, which leads to a dramatic improvement of encoding efficiency. Experiments performed with large ITC'99 benchmark circuits presents the effectiveness of the proposed technique and the test data volume is reduced up to 92% compared to random-filled test patterns.
URL: https://global.ieice.org/en_transactions/information/10.1587/transinf.E93.D.380/_p
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@ARTICLE{e93-d_2_380,
author={Yongjoon KIM, Jaeseok PARK, Sungho KANG, },
journal={IEICE TRANSACTIONS on Information},
title={Selective Scan Slice Grouping Technique for Efficient Test Data Compression},
year={2010},
volume={E93-D},
number={2},
pages={380-383},
abstract={This paper presents a selective scan slice grouping technique for test data compression. In conventional selective encoding methods, the existence of a conflict bit contributes to large encoding data. However, many conflict bits are efficiently removed using the scan slice grouping technique, which leads to a dramatic improvement of encoding efficiency. Experiments performed with large ITC'99 benchmark circuits presents the effectiveness of the proposed technique and the test data volume is reduced up to 92% compared to random-filled test patterns.},
keywords={},
doi={10.1587/transinf.E93.D.380},
ISSN={1745-1361},
month={February},}
Copy
TY - JOUR
TI - Selective Scan Slice Grouping Technique for Efficient Test Data Compression
T2 - IEICE TRANSACTIONS on Information
SP - 380
EP - 383
AU - Yongjoon KIM
AU - Jaeseok PARK
AU - Sungho KANG
PY - 2010
DO - 10.1587/transinf.E93.D.380
JO - IEICE TRANSACTIONS on Information
SN - 1745-1361
VL - E93-D
IS - 2
JA - IEICE TRANSACTIONS on Information
Y1 - February 2010
AB - This paper presents a selective scan slice grouping technique for test data compression. In conventional selective encoding methods, the existence of a conflict bit contributes to large encoding data. However, many conflict bits are efficiently removed using the scan slice grouping technique, which leads to a dramatic improvement of encoding efficiency. Experiments performed with large ITC'99 benchmark circuits presents the effectiveness of the proposed technique and the test data volume is reduced up to 92% compared to random-filled test patterns.
ER -
English
