Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.

In CAD and curve-fitting fields, we want to generate such rational cubic Bezier curve which is a unique curve passed given points and convenient to connect other curve segments with C1 connection. However, the method proposed in paper [1] can not meet above objective. in this paper, we propose a new method for generating a unique rational cubic Bezier curve which passed given points. The generated curve is with given tangent vectors at its two end points, and it is convenient to connect other curve segments with C1 connection. Also, some examples of curve generated by this method are given.