IEICE TRANSACTIONS on Information
Test Generation for Test Compression Based on Statistical Coding
Summary :
Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.
- Publication
- IEICE TRANSACTIONS on Information Vol.E85-D No.10 pp.1466-1473
- Publication Date
- 2002/10/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- Special Section PAPER (Special Issue on Test and Verification of VLSI)
- Category
- Test Generation and Modification
Authors
Keyword
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Hideyuki ICHIHARA, Atsuhiro OGAWA, Tomoo INOUE, Akio TAMURA, "Test Generation for Test Compression Based on Statistical Coding" in IEICE TRANSACTIONS on Information,
vol. E85-D, no. 10, pp. 1466-1473, October 2002, doi: .
Abstract: Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.
URL: https://global.ieice.org/en_transactions/information/10.1587/e85-d_10_1466/_p
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@ARTICLE{e85-d_10_1466,
author={Hideyuki ICHIHARA, Atsuhiro OGAWA, Tomoo INOUE, Akio TAMURA, },
journal={IEICE TRANSACTIONS on Information},
title={Test Generation for Test Compression Based on Statistical Coding},
year={2002},
volume={E85-D},
number={10},
pages={1466-1473},
abstract={Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.},
keywords={},
doi={},
ISSN={},
month={October},}
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TY - JOUR
TI - Test Generation for Test Compression Based on Statistical Coding
T2 - IEICE TRANSACTIONS on Information
SP - 1466
EP - 1473
AU - Hideyuki ICHIHARA
AU - Atsuhiro OGAWA
AU - Tomoo INOUE
AU - Akio TAMURA
PY - 2002
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E85-D
IS - 10
JA - IEICE TRANSACTIONS on Information
Y1 - October 2002
AB - Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.
ER -
English
