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[Author] Atsushi YAMAZAKI(1hit)

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  • Verification of Scalable-Delay-Insensitive Asynchronous Circuits

    Atsushi YAMAZAKI  Hiroshi RYU  Tomohiro YONEDA  

     
    LETTER-Fault Tolerant Computing

      Vol:
    E82-D No:3
      Page(s):
    701-703

    The Scalable-Delay-Insensitive (SDI) model is proposed for high-performance asynchronous system design. In this paper, we focus on checking whether a circuit under SDI model satisfies some untimed properties, and formally show that checking these properties in the SDI model can be reduced to checking the same properties in the bounded delay model. This result suggests that the existing verification algorithms for the bounded delay model can be used for the verification of SDI circuits, which significantly helps the designers of SDI circuits.