A novel low-power kick-back reduced comparator for use in high-speed flash analog-to-digital converters (ADC) is presented. The proposed comparator combines cascode transistors to reduce the kick-back noise with a built-in threshold voltage to remove the static power consumption of a reference. Without degrading other figures, the kick-back noise is reduced by a factor 8, compared to a previous design without cascode transistors. An improved calibration structure is also proposed to improve linearity when used in an ADC. Simulated in a standard CMOS technology the comparator consumes 106.5 µW at 1.8 V power supply and 1 GHz clock frequency.

Time-interleaved (TI) analog-to-digital converters (ADCs) are frequently advocated as a power-efficient solution to realize the high sampling rates required in single-chip transceivers for the emerging communication schemes: ultra-wideband, fast serial links, cognitive-radio and software-defined radio. However, the combined effects of multiple distortion sources due to channel mismatches (bandwidth, offset, gain and timing) severely affect system performance and power consumption of a TI ADC and need to be accounted for since the earlier design phases. In this paper, system-level design of TI ADCs is addressed through a platform-based methodology, enabling effective investigation of different speed/resolution scenarios as well as the impact of parallelism on accuracy, yield, sampling-rate, area and power consumption. Design space exploration of a TI successive approximation ADC is performed top-down via Monte Carlo simulations, by exploiting behavioral models built bottom-up after characterizing feasible implementations of the main building blocks in a 90-nm 1-V CMOS process. As a result, two implementations of the TI ADC are proposed that are capable to provide an outstanding figure-of-merit below 0.15 pJ/conversion-step.