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Jun SATOH Hiroshi NAMBA Tadashi KIKUCHI Kenichi YAMADA Hidetoshi YOSHIOKA Miki TANAKA Ken SHONO
The mechanism for data retention failure of EPROM has been investigated by the Optical Beam Induced Current(OBIC) technique. It was found that the data of failure cells were changed from '1' to '0' during read-mode by laser irradiation by OBIC. The data in good cells was not changed. This result suggests the effective barrier height between Si and SiO2 is being lowered. In addition, the cross section technique revealed that gate electrode and gate oxide were exposed due to lack of dielectric layers. This defect seemed to be the cause of the barrier height lowering. The OBIC technique not only gives the failure location but a detailed information of the failure mechanism. We found that OBIC technique is a very powerful tool for the analysis of EPROM failure mechanisms. The usefulness of the Emission Micro Scope (EMS) technique is also discussed.
Kenichi YAMADA Isamu CHIBA Yoshio KARASAWA
As an optically controlled array antenna, a "two-laser type" using two laser diodes whose frequency difference is set to the desired microwave frequency has been proposed. In this paper, we confirm experimentally that the beamforming network of the two-laser type array antenna has very broadband characteristics by measuring the amplitude and phase of microwave signals at 1.5 GHz, 10 GHz and 20 GHz. Using the optically controlled beam forming network, the radiation pattern of a 4-element linear array antenna was measured at 1.5 GHz.