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[Author] Kentaro YOSHIOKA(4hit)

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  • A Tutorial and Review of Automobile Direct ToF LiDAR SoCs: Evolution of Next-Generation LiDARs Open Access

    Kentaro YOSHIOKA  

     
    INVITED PAPER

      Pubricized:
    2022/04/11
      Vol:
    E105-C No:10
      Page(s):
    534-543

    LiDAR is a distance sensor that plays a key role in the realization of advanced driver assistance systems (ADAS). In this paper, we present a tutorial and review of automotive direct time of flight (dToF) LiDAR from the aspect of circuit systems. We discuss the breakthrough in ADAS LiDARs through comparison with the first-generation LiDAR systems, which were conventionally high-cost and had an immature performance. We define current high-performance and low-cost LiDARs as next-generation LiDAR systems, which have significantly improved the cost and performance by integrating the photodetector, the readout circuit, and the signal processing unit into a single SoC. This paper targets reader who is new to ADAS LiDARs and will cover the basic principles of LiDAR, also comparing with range methods other than dToF. In addition, we discuss the development of this area through the latest research examples such as the 2-chip approach, 2D SPAD array, and 3D integrated LiDARs.

  • A 4–10 bit, 0.4–1 V Power Supply, Power Scalable Asynchronous SAR-ADC in 40 nm-CMOS with Wide Supply Voltage Range SAR Controller

    Akira SHIKATA  Ryota SEKIMOTO  Kentaro YOSHIOKA  Tadahiro KURODA  Hiroki ISHIKURO  

     
    PAPER

      Vol:
    E96-A No:2
      Page(s):
    443-452

    This paper presents a wide range in supply voltage, resolution, and sampling rate asynchronous successive approximation register (SAR) analog-to-digital converter (ADC). The proposed differential flip-flop in SAR logic and high efficiency wide range delay element extend the flexibility of speed and resolution tradeoff. The ADC fabricated in 40 nm CMOS process covers 4–10 bit resolution and 0.4–1 V power supply range. The ADC achieved 49.8 dB SNDR and the peak FoM of 3.4 fJ/conv. with 160 kS/sec at 0.4 V single power supply voltage. At 10 bit mode and 1 V operation, up to 10 MS/s, the FoM is below 10 fJ/conv. while keeping ENOB of 8.7 bit.

  • Time-Based Current Source: A Highly Digital Robust Current Generator for Switched Capacitor Circuits

    Kentaro YOSHIOKA  

     
    PAPER

      Pubricized:
    2022/01/05
      Vol:
    E105-C No:7
      Page(s):
    324-333

    The resistor variation can severely affect current reference sources, which may vary up to ±40% in scaled CMOS processes. In addition, such variations make the opamp design challenging and increase the design margin, impacting power consumption. This paper proposes a Time-Based Current Source (TBCS): a robust and process-scalable reference current source suitable for switched-capacitor (SC) circuits. We construct a delay-locked-loop (DLL) to lock the current-starved inverter with the reference clock, enabling the use of the settled current directly as a reference current. Since the load capacitors determine the delay, the generated current is decoupled from resistor values and enables a robust reference current source. The prototype TBCS fabricated in 28nm CMOS achieved a minimal area of 1200um2. The current variation is suppressed to half compared to BGR based current sources, confirmed in extensive PVT variation simulations. Moreover, when used as the opamp's bias, TBCS achieves comparable opamp GBW to an ideal current source.

  • An Adaptive DAC Settling Waiting Time Optimized Ultra Low Voltage Asynchronous SAR ADC in 40 nm CMOS

    Ryota SEKIMOTO  Akira SHIKATA  Kentaro YOSHIOKA  Tadahiro KURODA  Hiroki ISHIKURO  

     
    PAPER

      Vol:
    E96-C No:6
      Page(s):
    820-827

    An ultra low power and low voltage successive-approximation-register (SAR) analog-to-digital converter (ADC) with timing optimized asynchronous clock generator is presented. By calibrating the delay amount of the clock generator, the DAC settling waiting time is adaptively optimized to counter the device mismatch. This technique improved the maximum sampling frequency by 40% keeping ENOB around 7-bit at 0.4 V analog and 0.7 V digital power supply voltage. The delay time dependency on power supply has small effect to the accuracy of conversion. Decreasing of supply voltage by 9% degrades ENOB only by 0.1-bit, and the proposed calibration can give delay margins for high voltage swing. The prototype ADC fabricated in 40 nm CMOS process achieved figure of merit (FoM) of 8.75-fJ/conversion-step with 2.048 MS/s at 0.6 V analog and 0.7 V digital power supply voltage. The ADC can operates from 50 S/s to 8 MS/s keeping ENOB over 7.5-bit.