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[Author] Koichi YOKOMIZO(2hit)

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  • 622 Mbps 8 mW CMOS Low-Voltage Interface Circuit

    Takashi TOMITA  Koichi YOKOMIZO  Takao HIRAKOSO  Kazukiyo HAGA  Kuniharu HIROSE  

     
    PAPER

      Vol:
    E78-C No:12
      Page(s):
    1726-1732

    This paper describes ALINX (Advanced Low-voltage Interface Circuit System), a low-power and high-speed interface circuit of submicron CMOS LSI for digital information and telecommunications systems. Differential and single-ended ALINXs are low-voltage swing I/O interface circuits with less than 1.0 V swing from a 1.2 V supply. Specifically, the differential ALINX features a pair of complementary NMOS push-pull drivers operating from a 1.2 V supply, reducing power consumption compared to conventional high-speed interface circuits operating from a 5 V or 3.3 V supply. The DC power consumption is approximately 11% of ECL. We observed 622 Mbps differential transmission with 8 mW power consumption and single-ended transmission at 311 Mbps with 14 mW with a PN23 pseudo-random pattern. We also describe a noise characteristic and ALINX applications to high-speed data buses and LSI for telecommunications systems. A time/space switch LSI with 0.9 W total power consumption was fabricated by 0.5 µm CMOS process technology. This chip can use a plastic QFP.

  • Design Techniques for High-Throughput BiCMOS Self-Timed SRAM's

    Koichi YOKOMIZO  Kuniyoshi NAITO  

     
    PAPER

      Vol:
    E76-C No:5
      Page(s):
    824-829

    This paper describes design techniques for a high-throughput BiCMOS self-timed SRAM. A new BiCMOS read circuit using a pipelined read architecture and a BiCMOS complementary clocked driver (BCCD) are proposed to reduce the operating cycle time. A 8192 9-b dual-port self-timed SRAM designed using the proposed techniques achieved a clock cycle time of 3.0 ns, that is, a 333-MHz operating frequency, by SPICE simulation on model parameters for 0.8-µm BiCMOS technology. A high-speed built-in self-test (BIST) circuit was studied and designed for the 3.0-ns cycle SRAM. It is confirmed that the BIST circuit allows the 3.0-ns cycle SRAM to test at its maximum operating frequency.