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[Author] Naoaki SUGANUMA(3hit)

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  • A Logic Diagnosis Technique for Multiple Output Circuit

    Naoaki SUGANUMA  Nobuto UEDA  Masahiro TOMITA  Kotaro HIRANO  

     
    PAPER

      Vol:
    E75-A No:10
      Page(s):
    1263-1271

    This paper presents the EXM-algorithm, which locates multiple logic design errors in a combinational circuit with multiple output. The error possibility index and the six-valued simulation method have been enhanced to be applied to multiple output circuit. The algorithm locates multiple errors even if they belong to different cone circuits, and processes faster than the conventional EX-algorithm for circuits with the similar gate sizes. Experimental results have shown that the algorithm locates all errors at high hit ratio for ISCAS benchmark circuits and some other circuits.

  • Reconfigurable Machine and its Application to Logic Simulation

    Nasahiro TOMITA  Naoaki SUGANUMA  Kotaro HIRANO  

     
    PAPER

      Vol:
    E76-A No:10
      Page(s):
    1705-1712

    This paper presents a Reconfigurable Machine (RM). capable of efficiently implementing a wide range of computationlly complex algorithms. Its highly flexble architecture combining FPGA's with RAM's supports a wide range of applications. Since its "gate-level programmability" allows us to implement various kinds of parallel processing techniques, RM provides a perfomance comparable to exising "special-purpose" engines. The in-circuit reconfiguration capability of FPGA's is used to reload several kinds of configuration data during power on. Thus, RM behaves itself like a general-purpose computer applicable to various kinds of applications by loading programs. A Reconfigurable Machine-(RM-) has been built as the first prototype incorporating five FPGA's and four SRAM memory banks. RM- has been applied to a multiple-delay Logic Simulator (LSIM). Employing pipeline architecture, LSIM has achieved a perfomance of l million gate events per second at 4MHz. The concept of RM is the best solution to the trade-offs between general-purpose machines and special-purpose ones. RM will be a hardware platform accelerating a wide range of applications, also offering an interesting problem in high-level synthesis.

  • Pattern Generation for Locating Logic Design Errors

    Masahiro TOMITA  Naoaki SUGANUMA  Kotaro HIRANO  

     
    PAPER-Computer Aided Design (CAD)

      Vol:
    E77-A No:5
      Page(s):
    881-893

    This paper presents techniques for generating the input patterns for locating logic design errors (PLE's) by Boolean function manipulation based on binary decision diagrams (BDD's). One PLE has one Boolean variable X or and constant values. A primary output of a correct circuit takes value X, while the designed circuit takes either 0 or 1. By using PLE's, the X-algorithms locate single or multiple logic design errors in a combinational circuit. Although PLE's play the most important role in the X-algorithms, the condition under which PLE's exist has not been formalized. This paper gives a formal analysis on the existence condition of PLE's. It is shown that the condition is always satisfied by incorporating another type of PLE. From the condition, an implicit representation of PLE's is derived. In addition, two kinds of approaches are presented for generating PLE's by Boolean function manipulation based on BDD's. One is an approach for generating all the existing PLE's. The other is a heuristic approach to obtain a limited number of PLE's in a short time. Both approaches generate PLE's including don't cares. Incorporating them, a compact representation of PLE is achieved. Experimental results have shown the compactness of the proposed representations and the availability of the pattern generation techniques.