1-3hit |
Naoaki SUGANUMA Nobuto UEDA Masahiro TOMITA Kotaro HIRANO
This paper presents the EXM-algorithm, which locates multiple logic design errors in a combinational circuit with multiple output. The error possibility index and the six-valued simulation method have been enhanced to be applied to multiple output circuit. The algorithm locates multiple errors even if they belong to different cone circuits, and processes faster than the conventional EX-algorithm for circuits with the similar gate sizes. Experimental results have shown that the algorithm locates all errors at high hit ratio for ISCAS benchmark circuits and some other circuits.
Nasahiro TOMITA Naoaki SUGANUMA Kotaro HIRANO
This paper presents a Reconfigurable Machine (RM). capable of efficiently implementing a wide range of computationlly complex algorithms. Its highly flexble architecture combining FPGA's with RAM's supports a wide range of applications. Since its "gate-level programmability" allows us to implement various kinds of parallel processing techniques, RM provides a perfomance comparable to exising "special-purpose" engines. The in-circuit reconfiguration capability of FPGA's is used to reload several kinds of configuration data during power on. Thus, RM behaves itself like a general-purpose computer applicable to various kinds of applications by loading programs. A Reconfigurable Machine-(RM-) has been built as the first prototype incorporating five FPGA's and four SRAM memory banks. RM- has been applied to a multiple-delay Logic Simulator (LSIM). Employing pipeline architecture, LSIM has achieved a perfomance of l million gate events per second at 4MHz. The concept of RM is the best solution to the trade-offs between general-purpose machines and special-purpose ones. RM will be a hardware platform accelerating a wide range of applications, also offering an interesting problem in high-level synthesis.
Masahiro TOMITA Naoaki SUGANUMA Kotaro HIRANO
This paper presents techniques for generating the input patterns for locating logic design errors (PLE's) by Boolean function manipulation based on binary decision diagrams (BDD's). One PLE has one Boolean variable X or