A model for analysis of life test data on typical electronic components is presented. Since viewpoint and manner for analysis of life test data is not established for humidity accelerated life tests, some life-time characteristics under humid environments are mainly considered in order to illustrate utility and applicability of the proposed model. Obtained results indicate that the model makes up possible to interpret some different models proposed by some researchers on the humidity accelerated life tests from a consistent manner connecting the life-time characteristic of components with fundamental nature of failure mechanism of each component. The model will allow to us to understand each of data obtained from some types of life tests on various electronic components as an essential part connected with whole information on life characteristic of the components under various use and environmental conditions.