A Unified Model of Life-Time Characteristics for Electronic Components under Humid Environments
Summary :
A model for analysis of life test data on typical electronic components is presented. Since viewpoint and manner for analysis of life test data is not established for humidity accelerated life tests, some life-time characteristics under humid environments are mainly considered in order to illustrate utility and applicability of the proposed model. Obtained results indicate that the model makes up possible to interpret some different models proposed by some researchers on the humidity accelerated life tests from a consistent manner connecting the life-time characteristic of components with fundamental nature of failure mechanism of each component. The model will allow to us to understand each of data obtained from some types of life tests on various electronic components as an essential part connected with whole information on life characteristic of the components under various use and environmental conditions.
- Publication
- IEICE TRANSACTIONS on transactions Vol.E63-E No.10 pp.707-714
- Publication Date
- 1980/10/25
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- PAPER
- Category
- Miscellaneous
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Toshio SHIMADA, "A Unified Model of Life-Time Characteristics for Electronic Components under Humid Environments" in IEICE TRANSACTIONS on transactions,
vol. E63-E, no. 10, pp. 707-714, October 1980, doi: .
Abstract: A model for analysis of life test data on typical electronic components is presented. Since viewpoint and manner for analysis of life test data is not established for humidity accelerated life tests, some life-time characteristics under humid environments are mainly considered in order to illustrate utility and applicability of the proposed model. Obtained results indicate that the model makes up possible to interpret some different models proposed by some researchers on the humidity accelerated life tests from a consistent manner connecting the life-time characteristic of components with fundamental nature of failure mechanism of each component. The model will allow to us to understand each of data obtained from some types of life tests on various electronic components as an essential part connected with whole information on life characteristic of the components under various use and environmental conditions.
URL: https://global.ieice.org/en_transactions/transactions/10.1587/e63-e_10_707/_p
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@ARTICLE{e63-e_10_707,
author={Toshio SHIMADA, },
journal={IEICE TRANSACTIONS on transactions},
title={A Unified Model of Life-Time Characteristics for Electronic Components under Humid Environments},
year={1980},
volume={E63-E},
number={10},
pages={707-714},
abstract={A model for analysis of life test data on typical electronic components is presented. Since viewpoint and manner for analysis of life test data is not established for humidity accelerated life tests, some life-time characteristics under humid environments are mainly considered in order to illustrate utility and applicability of the proposed model. Obtained results indicate that the model makes up possible to interpret some different models proposed by some researchers on the humidity accelerated life tests from a consistent manner connecting the life-time characteristic of components with fundamental nature of failure mechanism of each component. The model will allow to us to understand each of data obtained from some types of life tests on various electronic components as an essential part connected with whole information on life characteristic of the components under various use and environmental conditions.},
keywords={},
doi={},
ISSN={},
month={October},}
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TY - JOUR
TI - A Unified Model of Life-Time Characteristics for Electronic Components under Humid Environments
T2 - IEICE TRANSACTIONS on transactions
SP - 707
EP - 714
AU - Toshio SHIMADA
PY - 1980
DO -
JO - IEICE TRANSACTIONS on transactions
SN -
VL - E63-E
IS - 10
JA - IEICE TRANSACTIONS on transactions
Y1 - October 1980
AB - A model for analysis of life test data on typical electronic components is presented. Since viewpoint and manner for analysis of life test data is not established for humidity accelerated life tests, some life-time characteristics under humid environments are mainly considered in order to illustrate utility and applicability of the proposed model. Obtained results indicate that the model makes up possible to interpret some different models proposed by some researchers on the humidity accelerated life tests from a consistent manner connecting the life-time characteristic of components with fundamental nature of failure mechanism of each component. The model will allow to us to understand each of data obtained from some types of life tests on various electronic components as an essential part connected with whole information on life characteristic of the components under various use and environmental conditions.
ER -
English
