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[Author] Yue HAO(1hit)

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  • VLSI Yield Optimization Based on the Redundancy at the Sub-Processing-Element Level

    Tianxu ZHAO  Yue HAO  Yong-Chang JIAO  

     
    PAPER

      Vol:
    E84-D No:11
      Page(s):
    1471-1475

    An optimal allocation model for the sub-processing-element (sub-PE) level redundancy is developed, which is solved by the genetic algorithms. In the allocation model, the average defect density D and the parameter δ are also considered in order to accurately analyze the element yield, where δ is defined as the ratio of the support circuit area to the total area of a PE. When the PE's area is imposed on the constraint, the optimal solutions of the model with different D and δ are calculated. The simulation results indicate that, for any fixed average defect density D, both the number of the optimal redundant sub-circuit added into a PE and the PE's yield decrease as δ increases. Moreover, for any fixed parameter δ, the number of the optimal redundant sub-circuit increases, while the optimal yield of the PE decreases, as D increases.