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An optimal allocation model for the sub-processing-element (sub-PE) level redundancy is developed, which is solved by the genetic algorithms. In the allocation model, the average defect density *D* and the parameter δ are also considered in order to accurately analyze the element yield, where δ is defined as the ratio of the support circuit area to the total area of a PE. When the PE's area is imposed on the constraint, the optimal solutions of the model with different *D* and δ are calculated. The simulation results indicate that, for any fixed average defect density *D*, both the number of the optimal redundant sub-circuit added into a PE and the PE's yield decrease as δ increases. Moreover, for any fixed parameter δ, the number of the optimal redundant sub-circuit increases, while the optimal yield of the PE decreases, as *D* increases.

- Publication
- IEICE TRANSACTIONS on Information Vol.E84-D No.11 pp.1471-1475

- Publication Date
- 2001/11/01

- Publicized

- Online ISSN

- DOI

- Type of Manuscript
- Special Section PAPER (Special Issue on Function Integrated Information Systems)

- Category

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Tianxu ZHAO, Yue HAO, Yong-Chang JIAO, "VLSI Yield Optimization Based on the Redundancy at the Sub-Processing-Element Level" in IEICE TRANSACTIONS on Information,
vol. E84-D, no. 11, pp. 1471-1475, November 2001, doi: .

Abstract: An optimal allocation model for the sub-processing-element (sub-PE) level redundancy is developed, which is solved by the genetic algorithms. In the allocation model, the average defect density *D* and the parameter δ are also considered in order to accurately analyze the element yield, where δ is defined as the ratio of the support circuit area to the total area of a PE. When the PE's area is imposed on the constraint, the optimal solutions of the model with different *D* and δ are calculated. The simulation results indicate that, for any fixed average defect density *D*, both the number of the optimal redundant sub-circuit added into a PE and the PE's yield decrease as δ increases. Moreover, for any fixed parameter δ, the number of the optimal redundant sub-circuit increases, while the optimal yield of the PE decreases, as *D* increases.

URL: https://global.ieice.org/en_transactions/information/10.1587/e84-d_11_1471/_p

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@ARTICLE{e84-d_11_1471,

author={Tianxu ZHAO, Yue HAO, Yong-Chang JIAO, },

journal={IEICE TRANSACTIONS on Information},

title={VLSI Yield Optimization Based on the Redundancy at the Sub-Processing-Element Level},

year={2001},

volume={E84-D},

number={11},

pages={1471-1475},

abstract={An optimal allocation model for the sub-processing-element (sub-PE) level redundancy is developed, which is solved by the genetic algorithms. In the allocation model, the average defect density *D* and the parameter δ are also considered in order to accurately analyze the element yield, where δ is defined as the ratio of the support circuit area to the total area of a PE. When the PE's area is imposed on the constraint, the optimal solutions of the model with different *D* and δ are calculated. The simulation results indicate that, for any fixed average defect density *D*, both the number of the optimal redundant sub-circuit added into a PE and the PE's yield decrease as δ increases. Moreover, for any fixed parameter δ, the number of the optimal redundant sub-circuit increases, while the optimal yield of the PE decreases, as *D* increases.},

keywords={},

doi={},

ISSN={},

month={November},}

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TY - JOUR

TI - VLSI Yield Optimization Based on the Redundancy at the Sub-Processing-Element Level

T2 - IEICE TRANSACTIONS on Information

SP - 1471

EP - 1475

AU - Tianxu ZHAO

AU - Yue HAO

AU - Yong-Chang JIAO

PY - 2001

DO -

JO - IEICE TRANSACTIONS on Information

SN -

VL - E84-D

IS - 11

JA - IEICE TRANSACTIONS on Information

Y1 - November 2001

AB - An optimal allocation model for the sub-processing-element (sub-PE) level redundancy is developed, which is solved by the genetic algorithms. In the allocation model, the average defect density *D* and the parameter δ are also considered in order to accurately analyze the element yield, where δ is defined as the ratio of the support circuit area to the total area of a PE. When the PE's area is imposed on the constraint, the optimal solutions of the model with different *D* and δ are calculated. The simulation results indicate that, for any fixed average defect density *D*, both the number of the optimal redundant sub-circuit added into a PE and the PE's yield decrease as δ increases. Moreover, for any fixed parameter δ, the number of the optimal redundant sub-circuit increases, while the optimal yield of the PE decreases, as *D* increases.

ER -