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Four calculation techniques for the Q-factor determination of resonant structures are compared on the basis of the influence of the VNA measurement uncertainty. The influence is evaluated using Monte Carlo calculations. On the basis of the deviation, the dispersion, and the effect of nearby resonances, the circle fitting method is the most appropriate technique. Although the 3dB method is the most popular technique, the Q-factors calculated by this method exhibit deviations, and the sign and amount of the deviation depend on the measurement setup. Comparisons using measurement data demonstrate that the uncertainty of the dielectric loss tangent calculated by the circle fitting method is less than a third of those calculated by the other three techniques.
Toshiyuki KIJIMA Masatoshi KOTERA Hirosi SUGA Yoshiaki NAKASE
A Monte Carlo method for the passage of electrons based on a single scattering model is developed. A code based on this method is operable on personal computers, and has been applied to analyze electron behavior in a layered system consisting of Ti (an accelerator window), air, cellulose triacetate (CTA) and backing material irradiated by 300 keV electrons. The energy spectra and the angular distributions of electrons on the CTA surface as well as depth distributions of energy deposition in the CTA for various backing materials have been obtained. Some of these results are compared with experiments, and show fairly good agreement.