A novel jig structure for S11 calibration with short/open conditions and one reference material (referred to here as SOM) in dielectric measurement of liquids using a coaxial feed type stepped cut-off circular waveguide and a formula for exact calculation of S11 for the analytical model of the structure using the method of moments (MoM) was proposed. The accuracy and validity of S11 values calculated using the relevant formula was then verified for frequencies of 0.50, 1.5 and 3.0 GHz, and S11 measurement accuracy with each termination condition was verified after calibration with SOM by combining the jig of the proposed structure with the study's electromagnetic (EM) analysis method. The relative complex permittivity was then estimated from S11 values measured with various liquids in the jig after calibration, and differences in results obtained with the proposed method and the conventional jig, the analytical model and the EM analysis method were examined. The validity of the proposed dielectric measurement method based on a combination of the above jig structure, numerical S11 calculation and the calibration method was thus confirmed.

A method for the calibration of S11 at the front surface of a material for a coaxial-feed type cut-off circular waveguide with three reference materials inserted and no short termination condition was proposed as a preliminary step for dielectric measurement in liquids. The equations for jig calibration of S11 with these reference materials were first defined, and the electrostatic capacitance for the analytical model unique to the jig was quantified by substituting the reflection constant (calculated at frequencies of 0.50, 1.5 and 3.0 GHz using the mode-matching (MM) technique) into the equivalent circuit, assuming the sample liquid in the jig. The accuracy of S11 measured using the proposed method was then verified. S11 for the front surface of the sample material was also measured with various liquids in the jig after calibration, and the dielectric constants of the liquids were estimated as an inverse problem based on comparison of S11 calculated from an analytical model using EM analysis via the MM technique with the measured S11 values described above. The effectiveness of the proposed S11 calibration method was verified by comparison with dielectric constants estimated after S11 SOM (short, open and reference material) calibration and similar, with results showing favorable agreement with each method.