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Tomoko K. MATSUSHIMA Toshiyasu MATSUSHIMA Shigeichi HIRASAWA
This paper presents a new architecture for multiple-input signature analyzers. The proposed signature analyzer with Hδ inputs is designed by parallelizing a GLFSR(δ,m), where δ is the number of input signals and m is the number of stages in the feedback shift register. The GLFSR, developed by Pradhan and Gupta, is a general framework for representing LFSR-based signature analyzers. The parallelization technique described in this paper can be applied to any kind of GLFSR signature analyzer, e. g. , SISRs, MISRs, multiple MISRs and MLFSRs. It is shown that a proposed signature analyzer with Hδ inputs requires less complex hardware than either single GLFSR(Hδ,m)s or a parallel construction of the H original GLFSR(δ,m)s. It is also shown that the proposed signature analyzer, while requiring simpler hardware, has comparable aliasing probability with analyzers using conventional GLFSRs for some CUT error models of the same test response length and test time. The proposed technique would be practical for testing CUTs with a large number of output sequences, since the test circuit occupies a smaller area on the LSI chip than the conventional multiple-input signature analyzers of comparable aliasing probability.
Kazuhiko IWASAKI Sandeep K. GUPTA Prawat NAGVAJARA Tadao KASAMI
The aliasing probability was analyzed for MISRs when the error probability for each input was different. A closed form expression was derived by applying the complete weight distributions of linear codes over a Galois field and its dual codes. The aliasing probability for MISRs characterized by non-primitive polynomials was also analyzed. The inner product for binary representation of symbols was used instead of multiplication over a Galois field. The results show the perfect expression for analyzing the aliasing probability of MISRs.
Kazuhiko IWASAKI Shou-Ping FENG Toru FUJIWARA Tadao KASAMI
MISRs are widely used as signature circuits for VLSI built-in self tests. To improve the aliasing probability of MISRs, multiple MISRs and M-stage MISRs with m inputs are available, where M is grater than m. The aliasing probability as a function of the test length is analyzed for the compaction circuits for a binary symmetric channel. It is observed that the peak aliasing probability of the double MISRs is less than that of M-stage MISRs with m inputs. It is also shown that the final aliasing probability for a multiple MISR with d MISRs is 2dm and that for an M-stage MISR with m imputs is 2M if it is characterized by a primitive polynomial.