Automatic image inspector inspects the quality of printed circuit boards using image-processing technology. In this study, we change an automatic inspection problem into a problem for detecting the signal singularities. Based on the wavelet theory that the wavelet transform can focus on localized signal structures with a zooming procedure, a novel singularity detection and measurement algorithm is proposed. Singularity positions are detected with the local wavelet transform modulus maximum (WTMM) line, and the Lipschitz exponent is estimated at each singularity from the decay of the wavelet transform amplitude along the WTMM line. According to the theoretical analysis and computer simulation results, the proposed algorithm is shown to be successful for solving the automatic inspection problem and calculating the Lipschitz exponents of signals. These Lipschitz exponents successfully characterize singular behavior of signals at singularities.

The visual inspection of printed circuit boards (PCBs) at the final production stage is necessary for quality assurance and the requirements for an automated inspection system are very high. However, consistent inspection of patterns on these PCBs is very difficult due to pattern complexity. Most of the previously developed techniques are not sensitive enough to detect defects in complex patterns. To solve this problem, we propose a new optical system that discriminates pattern types existing on a PCB, such as copper, solder resist and silk-screen printing. We have also developed a hybrid defect detection technique to inspect discriminated patterns. This technique is based on shape measurement and features extraction methods. We used the proposed techniques in an actual automated inspection system, realizing real time transactions with a combination of hardware equipped with image processing LSIs and PC software. Evaluation with this inspection system ensures a 100% defect detection rate and a fairly low false alarm rate (0.06%). The present paper describes the inspection algorithm and briefly explains the automated inspection system.