An Efficient Algorithm for Detecting Singularity in Signals Using Wavelet Transform
Summary :
Automatic image inspector inspects the quality of printed circuit boards using image-processing technology. In this study, we change an automatic inspection problem into a problem for detecting the signal singularities. Based on the wavelet theory that the wavelet transform can focus on localized signal structures with a zooming procedure, a novel singularity detection and measurement algorithm is proposed. Singularity positions are detected with the local wavelet transform modulus maximum (WTMM) line, and the Lipschitz exponent is estimated at each singularity from the decay of the wavelet transform amplitude along the WTMM line. According to the theoretical analysis and computer simulation results, the proposed algorithm is shown to be successful for solving the automatic inspection problem and calculating the Lipschitz exponents of signals. These Lipschitz exponents successfully characterize singular behavior of signals at singularities.
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- IEICE TRANSACTIONS on Fundamentals Vol.E86-A No.10 pp.2639-2649
- Publication Date
- 2003/10/01
- Publicized
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- Type of Manuscript
- PAPER
- Category
- Digital Signal Processing
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Huiqin JIANG, Takashi YAHAGI, Jianming LU, "An Efficient Algorithm for Detecting Singularity in Signals Using Wavelet Transform" in IEICE TRANSACTIONS on Fundamentals,
vol. E86-A, no. 10, pp. 2639-2649, October 2003, doi: .
Abstract: Automatic image inspector inspects the quality of printed circuit boards using image-processing technology. In this study, we change an automatic inspection problem into a problem for detecting the signal singularities. Based on the wavelet theory that the wavelet transform can focus on localized signal structures with a zooming procedure, a novel singularity detection and measurement algorithm is proposed. Singularity positions are detected with the local wavelet transform modulus maximum (WTMM) line, and the Lipschitz exponent is estimated at each singularity from the decay of the wavelet transform amplitude along the WTMM line. According to the theoretical analysis and computer simulation results, the proposed algorithm is shown to be successful for solving the automatic inspection problem and calculating the Lipschitz exponents of signals. These Lipschitz exponents successfully characterize singular behavior of signals at singularities.
URL: https://global.ieice.org/en_transactions/fundamentals/10.1587/e86-a_10_2639/_p
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@ARTICLE{e86-a_10_2639,
author={Huiqin JIANG, Takashi YAHAGI, Jianming LU, },
journal={IEICE TRANSACTIONS on Fundamentals},
title={An Efficient Algorithm for Detecting Singularity in Signals Using Wavelet Transform},
year={2003},
volume={E86-A},
number={10},
pages={2639-2649},
abstract={Automatic image inspector inspects the quality of printed circuit boards using image-processing technology. In this study, we change an automatic inspection problem into a problem for detecting the signal singularities. Based on the wavelet theory that the wavelet transform can focus on localized signal structures with a zooming procedure, a novel singularity detection and measurement algorithm is proposed. Singularity positions are detected with the local wavelet transform modulus maximum (WTMM) line, and the Lipschitz exponent is estimated at each singularity from the decay of the wavelet transform amplitude along the WTMM line. According to the theoretical analysis and computer simulation results, the proposed algorithm is shown to be successful for solving the automatic inspection problem and calculating the Lipschitz exponents of signals. These Lipschitz exponents successfully characterize singular behavior of signals at singularities.},
keywords={},
doi={},
ISSN={},
month={October},}
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TY - JOUR
TI - An Efficient Algorithm for Detecting Singularity in Signals Using Wavelet Transform
T2 - IEICE TRANSACTIONS on Fundamentals
SP - 2639
EP - 2649
AU - Huiqin JIANG
AU - Takashi YAHAGI
AU - Jianming LU
PY - 2003
DO -
JO - IEICE TRANSACTIONS on Fundamentals
SN -
VL - E86-A
IS - 10
JA - IEICE TRANSACTIONS on Fundamentals
Y1 - October 2003
AB - Automatic image inspector inspects the quality of printed circuit boards using image-processing technology. In this study, we change an automatic inspection problem into a problem for detecting the signal singularities. Based on the wavelet theory that the wavelet transform can focus on localized signal structures with a zooming procedure, a novel singularity detection and measurement algorithm is proposed. Singularity positions are detected with the local wavelet transform modulus maximum (WTMM) line, and the Lipschitz exponent is estimated at each singularity from the decay of the wavelet transform amplitude along the WTMM line. According to the theoretical analysis and computer simulation results, the proposed algorithm is shown to be successful for solving the automatic inspection problem and calculating the Lipschitz exponents of signals. These Lipschitz exponents successfully characterize singular behavior of signals at singularities.
ER -
English
