We propose a C-testable multiple-block carry select adder with respect to the cell fault model. Full adders and 2:1 multiplexers are considered as cells. By an additional external input, we obtain a C-testable carry select adder. We only modify the least significant position of each block. The adder is testable with a test set consisting of 16 patterns regardless of the size of each block and the number of blocks. This is the minimum test set for the adder. We show two gate-level implementations of the adder which are testable with a test set of 9 patterns and 7 patterns respectively, with respect to the single stuck-at fault model.

A model for the floating point adder/subtractor which can perform rounding and addition/subtraction operations in parallel is presented. The major requirements and structure to achieve this goal are described and algebraically verified. Processing flow of the conventional floating point addition/subtraction operation consists of alignment, addition/subtraction, normalization, and rounding stages. In general, the rounding stage requires a high speed adder for increment, increasing the overall execution time and occupying a large amount of chip area. Furthermore, it accompanies additional execution time and hardware logics for renormalization stage which may occur by an overflow from the rounding operation. A floating adder/subtractor performing addition/subtraction and IEEE rounding in parallel is designed by optimizing the operational flow of floating point addition/subtraction operation. The floating point adder/subtractor presented does not require any additional execution time nor any high speed adder for rounding operation. In addition, the renormalization step is not required because the rounding step is performed prior to the normalization operation. Thus, performance improvement and cost-effective design can be achieved by this approach.