This paper presents the scattering characteristics of a TE electromagnetic plane wave by metallic strip gratings on an optically plasma-induced silicon slab at millimeter wave frequencies. The characteristics were analyzed by using the spectral domain Galerkin method and estimated numerically. We examined to control the resonance anomaly by changing the optically induced plasma density, and the metallic strip grating structures were fabricated on highly resistive silicon. The optical control characteristics of the reflection, and the forward scattering pattern by the grating structures, were measured at Q band and are discussed briefly with theory.