Scattering of Millimeter Waves by Metallic Strip Gratings on an Optically Plasma-Induced Semiconductor Slab
Summary :
This paper presents the scattering characteristics of a TE electromagnetic plane wave by metallic strip gratings on an optically plasma-induced silicon slab at millimeter wave frequencies. The characteristics were analyzed by using the spectral domain Galerkin method and estimated numerically. We examined to control the resonance anomaly by changing the optically induced plasma density, and the metallic strip grating structures were fabricated on highly resistive silicon. The optical control characteristics of the reflection, and the forward scattering pattern by the grating structures, were measured at Q band and are discussed briefly with theory.
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- IEICE TRANSACTIONS on Electronics Vol.E79-C No.10 pp.1378-1384
- Publication Date
- 1996/10/25
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- Type of Manuscript
- Special Section PAPER (Special Issue on Electromagnetic Theory-Foundations and Applications)
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Kazuo NISHIMURA, Makoto TSUTSUMI, "Scattering of Millimeter Waves by Metallic Strip Gratings on an Optically Plasma-Induced Semiconductor Slab" in IEICE TRANSACTIONS on Electronics,
vol. E79-C, no. 10, pp. 1378-1384, October 1996, doi: .
Abstract: This paper presents the scattering characteristics of a TE electromagnetic plane wave by metallic strip gratings on an optically plasma-induced silicon slab at millimeter wave frequencies. The characteristics were analyzed by using the spectral domain Galerkin method and estimated numerically. We examined to control the resonance anomaly by changing the optically induced plasma density, and the metallic strip grating structures were fabricated on highly resistive silicon. The optical control characteristics of the reflection, and the forward scattering pattern by the grating structures, were measured at Q band and are discussed briefly with theory.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e79-c_10_1378/_p
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@ARTICLE{e79-c_10_1378,
author={Kazuo NISHIMURA, Makoto TSUTSUMI, },
journal={IEICE TRANSACTIONS on Electronics},
title={Scattering of Millimeter Waves by Metallic Strip Gratings on an Optically Plasma-Induced Semiconductor Slab},
year={1996},
volume={E79-C},
number={10},
pages={1378-1384},
abstract={This paper presents the scattering characteristics of a TE electromagnetic plane wave by metallic strip gratings on an optically plasma-induced silicon slab at millimeter wave frequencies. The characteristics were analyzed by using the spectral domain Galerkin method and estimated numerically. We examined to control the resonance anomaly by changing the optically induced plasma density, and the metallic strip grating structures were fabricated on highly resistive silicon. The optical control characteristics of the reflection, and the forward scattering pattern by the grating structures, were measured at Q band and are discussed briefly with theory.},
keywords={},
doi={},
ISSN={},
month={October},}
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TY - JOUR
TI - Scattering of Millimeter Waves by Metallic Strip Gratings on an Optically Plasma-Induced Semiconductor Slab
T2 - IEICE TRANSACTIONS on Electronics
SP - 1378
EP - 1384
AU - Kazuo NISHIMURA
AU - Makoto TSUTSUMI
PY - 1996
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E79-C
IS - 10
JA - IEICE TRANSACTIONS on Electronics
Y1 - October 1996
AB - This paper presents the scattering characteristics of a TE electromagnetic plane wave by metallic strip gratings on an optically plasma-induced silicon slab at millimeter wave frequencies. The characteristics were analyzed by using the spectral domain Galerkin method and estimated numerically. We examined to control the resonance anomaly by changing the optically induced plasma density, and the metallic strip grating structures were fabricated on highly resistive silicon. The optical control characteristics of the reflection, and the forward scattering pattern by the grating structures, were measured at Q band and are discussed briefly with theory.
ER -
English
