The single fault model is invalid in many cases. However, it is very difficult to generate tests for all multiple faults since an m-line circuit may have 3m --1 multiple faults. In this paper, we describe a method for generating tests for combinational circuits with multiple stuck-at faults. An input vector is a test for a fault on a target line, if it find the target line to be fault-free in the presence of undetected or undetectable lines. The test is called a robust test for fault on a target line. It is shown that the sensitizing input-pair for a completely single sensitized path can be a robust test-pair. The method described here consists of two procedures. We label these as SINGLE_SEN" procedure and DECISION" procedure. SINGLE_SEN generates a single sensitized path including a target line on it by using a PODEM-like method which uses a new seven-valued calculus. DECISION determines by utilizing the method proposed by H. Cox and J. Rajski whether the single sensitizing input-pair generated by the SINGLE_SEN is a robust test-pair. By using these two procedures the described method generates robust test-pairs for the combinational circuit with multiple stuck-at faults. Finally, we demonstrate by experimental results on the ISCAS85 benchmark circuits that SINGLE_SEN is effective for an algorithmic multiple fault test generation for circuits not including many XOR gates.