A Method of Generating Tests for Combinational Circuits with Multiple Faults

Hiroshi TAKAHASHI; Nobukage IUCHI; Yuzo TAKAMATSU

A Method of Generating Tests for Combinational Circuits with Multiple Faults

Hiroshi TAKAHASHI, Nobukage IUCHI, Yuzo TAKAMATSU

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The single fault model is invalid in many cases. However, it is very difficult to generate tests for all multiple faults since an m-line circuit may have 3^m --1 multiple faults. In this paper, we describe a method for generating tests for combinational circuits with multiple stuck-at faults. An input vector is a test for a fault on a target line, if it find the target line to be fault-free in the presence of undetected or undetectable lines. The test is called a robust test for fault on a target line. It is shown that the sensitizing input-pair for a completely single sensitized path can be a robust test-pair. The method described here consists of two procedures. We label these as SINGLE_SEN" procedure and DECISION" procedure. SINGLE_SEN generates a single sensitized path including a target line on it by using a PODEM-like method which uses a new seven-valued calculus. DECISION determines by utilizing the method proposed by H. Cox and J. Rajski whether the single sensitizing input-pair generated by the SINGLE_SEN is a robust test-pair. By using these two procedures the described method generates robust test-pairs for the combinational circuit with multiple stuck-at faults. Finally, we demonstrate by experimental results on the ISCAS85 benchmark circuits that SINGLE_SEN is effective for an algorithmic multiple fault test generation for circuits not including many XOR gates.

Publication: IEICE TRANSACTIONS on Information Vol.E75-D No.4 pp.569-576

Publication Date: 1992/07/25

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Type of Manuscript: PAPER

Category: Fault Tolerant Computing

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Hiroshi TAKAHASHI, Nobukage IUCHI, Yuzo TAKAMATSU, "A Method of Generating Tests for Combinational Circuits with Multiple Faults" in IEICE TRANSACTIONS on Information, vol. E75-D, no. 4, pp. 569-576, July 1992, doi: .
Abstract: The single fault model is invalid in many cases. However, it is very difficult to generate tests for all multiple faults since an m-line circuit may have 3^m --1 multiple faults. In this paper, we describe a method for generating tests for combinational circuits with multiple stuck-at faults. An input vector is a test for a fault on a target line, if it find the target line to be fault-free in the presence of undetected or undetectable lines. The test is called a robust test for fault on a target line. It is shown that the sensitizing input-pair for a completely single sensitized path can be a robust test-pair. The method described here consists of two procedures. We label these as SINGLE_SEN" procedure and DECISION" procedure. SINGLE_SEN generates a single sensitized path including a target line on it by using a PODEM-like method which uses a new seven-valued calculus. DECISION determines by utilizing the method proposed by H. Cox and J. Rajski whether the single sensitizing input-pair generated by the SINGLE_SEN is a robust test-pair. By using these two procedures the described method generates robust test-pairs for the combinational circuit with multiple stuck-at faults. Finally, we demonstrate by experimental results on the ISCAS85 benchmark circuits that SINGLE_SEN is effective for an algorithmic multiple fault test generation for circuits not including many XOR gates.
URL: https://global.ieice.org/en_transactions/information/10.1587/e75-d_4_569/_p

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@ARTICLE{e75-d_4_569,
author={Hiroshi TAKAHASHI, Nobukage IUCHI, Yuzo TAKAMATSU, },
journal={IEICE TRANSACTIONS on Information},
title={A Method of Generating Tests for Combinational Circuits with Multiple Faults},
year={1992},
volume={E75-D},
number={4},
pages={569-576},
abstract={The single fault model is invalid in many cases. However, it is very difficult to generate tests for all multiple faults since an m-line circuit may have 3^m --1 multiple faults. In this paper, we describe a method for generating tests for combinational circuits with multiple stuck-at faults. An input vector is a test for a fault on a target line, if it find the target line to be fault-free in the presence of undetected or undetectable lines. The test is called a robust test for fault on a target line. It is shown that the sensitizing input-pair for a completely single sensitized path can be a robust test-pair. The method described here consists of two procedures. We label these as SINGLE_SEN" procedure and DECISION" procedure. SINGLE_SEN generates a single sensitized path including a target line on it by using a PODEM-like method which uses a new seven-valued calculus. DECISION determines by utilizing the method proposed by H. Cox and J. Rajski whether the single sensitizing input-pair generated by the SINGLE_SEN is a robust test-pair. By using these two procedures the described method generates robust test-pairs for the combinational circuit with multiple stuck-at faults. Finally, we demonstrate by experimental results on the ISCAS85 benchmark circuits that SINGLE_SEN is effective for an algorithmic multiple fault test generation for circuits not including many XOR gates.},
keywords={},
doi={},
ISSN={},
month={July},}

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TY - JOUR
TI - A Method of Generating Tests for Combinational Circuits with Multiple Faults
T2 - IEICE TRANSACTIONS on Information
SP - 569
EP - 576
AU - Hiroshi TAKAHASHI
AU - Nobukage IUCHI
AU - Yuzo TAKAMATSU
PY - 1992
DO -
JO - IEICE TRANSACTIONS on Information
SN -
VL - E75-D
IS - 4
JA - IEICE TRANSACTIONS on Information
Y1 - July 1992
AB - The single fault model is invalid in many cases. However, it is very difficult to generate tests for all multiple faults since an m-line circuit may have 3^m --1 multiple faults. In this paper, we describe a method for generating tests for combinational circuits with multiple stuck-at faults. An input vector is a test for a fault on a target line, if it find the target line to be fault-free in the presence of undetected or undetectable lines. The test is called a robust test for fault on a target line. It is shown that the sensitizing input-pair for a completely single sensitized path can be a robust test-pair. The method described here consists of two procedures. We label these as SINGLE_SEN" procedure and DECISION" procedure. SINGLE_SEN generates a single sensitized path including a target line on it by using a PODEM-like method which uses a new seven-valued calculus. DECISION determines by utilizing the method proposed by H. Cox and J. Rajski whether the single sensitizing input-pair generated by the SINGLE_SEN is a robust test-pair. By using these two procedures the described method generates robust test-pairs for the combinational circuit with multiple stuck-at faults. Finally, we demonstrate by experimental results on the ISCAS85 benchmark circuits that SINGLE_SEN is effective for an algorithmic multiple fault test generation for circuits not including many XOR gates.
ER -