A resonant slit-type probe is proposed in this paper that can improve measurement sensitivity in millimeter-wave scanning near-field microscopy. The probe consists of a rectangular metal waveguide incorporating the following three sections; a straight section at the tip of the probe whose height is much smaller than the operating wavelength; a standard-height waveguide section; a quarter-wave transformer section to achieve impedance-matching between the other sections. The design procedure used for the probe is presented in detail and the performance of the fabricated resonant probe is evaluated experimentally. Experiments performed at U-band frequencies in which we reconstruct 2D images show that the sensitivity of the resonant probe is improved by more than four times compared with a conventional tapered slit-type probe. Some experimental results are compared with those obtained using the finite element method (Ansoft HFSS). Good agreement is demonstrated.