A Resonant Slit-Type Probe for Millimeter-Wave Scanning Near-Field Microscopy
Summary :
A resonant slit-type probe is proposed in this paper that can improve measurement sensitivity in millimeter-wave scanning near-field microscopy. The probe consists of a rectangular metal waveguide incorporating the following three sections; a straight section at the tip of the probe whose height is much smaller than the operating wavelength; a standard-height waveguide section; a quarter-wave transformer section to achieve impedance-matching between the other sections. The design procedure used for the probe is presented in detail and the performance of the fabricated resonant probe is evaluated experimentally. Experiments performed at U-band frequencies in which we reconstruct 2D images show that the sensitivity of the resonant probe is improved by more than four times compared with a conventional tapered slit-type probe. Some experimental results are compared with those obtained using the finite element method (Ansoft HFSS). Good agreement is demonstrated.
- Publication
- IEICE TRANSACTIONS on Electronics Vol.E87-C No.12 pp.2158-2163
- Publication Date
- 2004/12/01
- Publicized
- Online ISSN
- DOI
- Type of Manuscript
- PAPER
- Category
- Microwaves, Millimeter-Waves
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Tatsuo NOZOKIDO, Tomohiro OHBAYASHI, Jongsuck BAE, Koji MIZUNO, "A Resonant Slit-Type Probe for Millimeter-Wave Scanning Near-Field Microscopy" in IEICE TRANSACTIONS on Electronics,
vol. E87-C, no. 12, pp. 2158-2163, December 2004, doi: .
Abstract: A resonant slit-type probe is proposed in this paper that can improve measurement sensitivity in millimeter-wave scanning near-field microscopy. The probe consists of a rectangular metal waveguide incorporating the following three sections; a straight section at the tip of the probe whose height is much smaller than the operating wavelength; a standard-height waveguide section; a quarter-wave transformer section to achieve impedance-matching between the other sections. The design procedure used for the probe is presented in detail and the performance of the fabricated resonant probe is evaluated experimentally. Experiments performed at U-band frequencies in which we reconstruct 2D images show that the sensitivity of the resonant probe is improved by more than four times compared with a conventional tapered slit-type probe. Some experimental results are compared with those obtained using the finite element method (Ansoft HFSS). Good agreement is demonstrated.
URL: https://global.ieice.org/en_transactions/electronics/10.1587/e87-c_12_2158/_p
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@ARTICLE{e87-c_12_2158,
author={Tatsuo NOZOKIDO, Tomohiro OHBAYASHI, Jongsuck BAE, Koji MIZUNO, },
journal={IEICE TRANSACTIONS on Electronics},
title={A Resonant Slit-Type Probe for Millimeter-Wave Scanning Near-Field Microscopy},
year={2004},
volume={E87-C},
number={12},
pages={2158-2163},
abstract={A resonant slit-type probe is proposed in this paper that can improve measurement sensitivity in millimeter-wave scanning near-field microscopy. The probe consists of a rectangular metal waveguide incorporating the following three sections; a straight section at the tip of the probe whose height is much smaller than the operating wavelength; a standard-height waveguide section; a quarter-wave transformer section to achieve impedance-matching between the other sections. The design procedure used for the probe is presented in detail and the performance of the fabricated resonant probe is evaluated experimentally. Experiments performed at U-band frequencies in which we reconstruct 2D images show that the sensitivity of the resonant probe is improved by more than four times compared with a conventional tapered slit-type probe. Some experimental results are compared with those obtained using the finite element method (Ansoft HFSS). Good agreement is demonstrated.},
keywords={},
doi={},
ISSN={},
month={December},}
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TY - JOUR
TI - A Resonant Slit-Type Probe for Millimeter-Wave Scanning Near-Field Microscopy
T2 - IEICE TRANSACTIONS on Electronics
SP - 2158
EP - 2163
AU - Tatsuo NOZOKIDO
AU - Tomohiro OHBAYASHI
AU - Jongsuck BAE
AU - Koji MIZUNO
PY - 2004
DO -
JO - IEICE TRANSACTIONS on Electronics
SN -
VL - E87-C
IS - 12
JA - IEICE TRANSACTIONS on Electronics
Y1 - December 2004
AB - A resonant slit-type probe is proposed in this paper that can improve measurement sensitivity in millimeter-wave scanning near-field microscopy. The probe consists of a rectangular metal waveguide incorporating the following three sections; a straight section at the tip of the probe whose height is much smaller than the operating wavelength; a standard-height waveguide section; a quarter-wave transformer section to achieve impedance-matching between the other sections. The design procedure used for the probe is presented in detail and the performance of the fabricated resonant probe is evaluated experimentally. Experiments performed at U-band frequencies in which we reconstruct 2D images show that the sensitivity of the resonant probe is improved by more than four times compared with a conventional tapered slit-type probe. Some experimental results are compared with those obtained using the finite element method (Ansoft HFSS). Good agreement is demonstrated.
ER -
English
