To improve the observability during the post-silicon validation, it is the key to select the limited trace signals effectively for the data acquisition. This paper proposes an automated trace signal selection algorithm, which uses the pruning-based strategy to reduce the exploration space. First, the restoration range is covered for each candidate signals. Second, the constraints are generated based on the conjunctive normal form (CNF) to avoid the conflict. Finally the candidates are selected through pruning-based enumeration. The experimental results indicate that the proposed algorithm can bring higher restoration ratios and is more effective compared to existing methods.

Post-silicon debugging is getting even more critical to shorten the time-to-market than ever, as many more bugs escape pre-silicon verification according to the increasing design scale and complexity. Post-silicon debugging is generally harder than pre-silicon debugging due to the limited observability and controllability of internal signal values. Conventionally, simulation of corresponding low-level designs such as RTL or gate-level has been used to get observability and controllability, which is inefficient for contemporary large designs. In this paper, we introduce a post-silicon debugging approach using simulation of high-level designs, instead of low-level designs. To realize such a debugging approach, we propose an I/O sequence mapping method that converts I/O sequences of chip executions to those of the corresponding high-level design. First, we provide a formal definition of I/O sequence mapping and relevant notions. Then, based on the definition, we propose an I/O sequence mapping method by executing FSMs representing the interface specifications of the target design. Also, we propose an implementation of the proposed method to get further efficiency. We demonstrate that the proposed method can be effectively applied to several practical design examples with various interfaces.