In the software testing phase, software reliability growth models (SRGMs) are commonly used to evaluate the reliability of software systems. Traditional SRGMs are restricted by their assumption of a continuous growth pattern for the failure detection rate (FDR) throughout the testing phase. However, the assumption is compromised by Change-Point phenomena, where FDR fluctuations stem from variations in testing personnel or procedural modifications, leading to reduced prediction accuracy and compromised software reliability assessments. Therefore, the objective of this study is to improve software reliability prediction using a novel approach that combines genetic algorithm (GA) and deep learning-based SRGMs to account for the Change-point phenomenon. The proposed approach uses a GA to dynamically combine activation functions from various deep learning-based SRGMs into a new mutated SRGM called MuSRGM. The MuSRGM captures the advantages of both concave and S-shaped SRGMs and is better suited to capture the change-point phenomenon during testing and more accurately reflect actual testing situations. Additionally, failure data is treated as a time series and analyzed using a combination of Long Short-Term Memory (LSTM) and Attention mechanisms. To assess the performance of MuSRGM, we conducted experiments on three distinct failure datasets. The results indicate that MuSRGM outperformed the baseline method, exhibiting low prediction error (MSE) on all three datasets. Furthermore, MuSRGM demonstrated remarkable generalization ability on these datasets, remaining unaffected by uneven data distribution. Therefore, MuSRGM represents a highly promising advanced solution that can provide increased accuracy and applicability for software reliability assessment during the testing phase.

We discuss software reliability assessment considering multiple changes of software fault-detection phenomenon. The testing-time when the characteristic of the software failure-occurrence or fault-detection phenomenon changes notably in the testing-phase of a software development process is called change-point. It is known that the occurrence of the change-point influences the accuracy for the software reliability assessment based on a software reliability growth models, which are mainly divided into software failure-occurrence time and fault counting models. This paper discusses software reliability growth modeling frameworks considering with the effect of the multiple change-point occurrence on the software reliability growth process in software failure-occurrence time and fault counting modeling. And we show numerical illustrations for the software reliability analyses based on our models by using actual data.

In this paper, we propose a new software reliability growth model which is the mixture of two exponential reliability growth models, one of which has the reliability growth and the other one does not have the reliability growth after the software is released upon completion of testing phase. The mixture of two such models is characterized by a weighted factor p, which is the proportion of reliability growth part within the model. Firstly, this paper discusses an optimal software release problem with regard to the expected total software cost incurred during the warranty period under the proposed software reliability growth model, which generalizes Kimura, Toyota and Yamada's (1999) model with consideration of the weighted factor. The second main purpose of this paper is to apply the Bayesian approach to the optimal software release policy by assuming the prior distributions for the unknown parameters contained in the proposed software reliability growth model. Some numerical examples are presented for the purpose of comparing the optimal software release policies depending on the choice of parameters by the non-Bayesian and Bayesian methods.

I describe a software reliability growth model that yields accurate parameter estimates even with a small amount of input data. The model is based on a proposed discrete analog of a Gompertz equation that has an exact solution. The difference equation tends to a differential equation on which the Gompertz curve model is defined, when the time interval tends to zero. The exact solution also tends to the exact solution of the differential equation when the time interval tends to zero. The discrete model conserves the characteristics of the Gompertz model because the difference equation has an exact solution. Therefore, the proposed model provides accurate parameter estimates, making it possible to predict in the early test phase when software can be released.

In this paper, we propose a plausible software reliability growth model by applying a mathematical technique of stochastic differential equations. First, we extend a basic differential equation describing the average behavior of software fault-detection processes during the testing phase to a stochastic differential equation of ItÔ type, and derive a probability distribution of its solution processes. Second, we obtain several software reliability measures from the probability distribution. Finally, applying a method of maximum-likelihood we estimate unknown parameters in our model by using available data in the actual software testing procedures, and numerically show the stochastic behavior of the number of faults remaining in the software system. Further, the model is compared among the existing software reliability growth models in terms of goodness-of-fit.