1-2hit |
Hiroyuki YOTSUYANAGI Masayuki YAMAMOTO Masaki HASHIZUME
In this paper, the scan chain ordering method for BIST-aided scan test for reducing test data and test application time is proposed. In this work, we utilize the simple LFSR without a phase shifter as PRPG and configure scan chains using the compatible set of flip-flops with considering the correlations among flip-flops in an LFSR. The method can reduce the number of inverter codes required for inverting the bits in PRPG patterns that conflict with ATPG patterns. The experimental results for some benchmark circuits are shown to present the feasibility of our test method.
Masayuki ARAI Satoshi FUKUMOTO Kazuhiko IWASAKI
In this paper, we propose a scheme for test data reduction which uses broadcaster along with bit-flipping circuit. The proposed scheme can reduce test data without degrading the fault coverage of ATPG, and without requiring or modifying the arrangement of CUT. We theoretically analyze the test data size by the proposed scheme. The numerical examples obtained by the analysis and experimental results show that our scheme can effectively reduce test data if the care-bit rate is not so much low according to the number of scan chains. We also discuss the hybrid scheme of random-pattern-based flipping and single-input-based flipping.